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N. Tiengo
Observed names:
N Tiengo,
Nadia Tiengo
Institutions:
University of Trento,
Istituto Nazionale per la Fisica della Materia
Observed institutions:
University of Trento,
Istituto Nazionale per la Fisica della Materia
OpenAlex ID:
A5033359679
Formation of vacancy clusters and cavities in He-implanted silicon studied by slow-positron annihilation spectroscopy
2000
·
Roberto S. Brusa
, Grzegorz P. Karwasz
, et al.
·
Physical review. B, Condensed matter
·
73
Helium-implanted silicon: A study of bubble precursors
1999
·
F. Corni
, G. Calzolari
, et al.
·
Journal of Applied Physics
·
52
He-implantation induced defects in Si studied by slow positron annihilation spectroscopy
1999
·
R. S. Brusa
, G. P. Karwasz
, et al.
·
Journal of Applied Physics
·
34
Microstructural analysis of hard amorphous carbon films deposited with high-energy ion beams
1999
·
R.S Brusa
, A Somoza
, et al.
·
Applied Surface Science
·
20
Evolution of Defect Profiles in He-Implanted Silicon Studied by Slow Positrons
1997
·
Roberto S. Brusa
, Grzegorz P. Karwasz
, et al.
·
Materials science forum
·
1
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Works count:
7
Citation count:
180
H-index:
4
I10-index:
4
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