Author

Selçuk Ersoy

Observed name: Selcuk Ersoy
Institution: NXP (Netherlands)
Observed institution: NXP (Netherlands)
OpenAlex ID: A5035306737
2013 · Selcuk Ersoy, Robert H.M. van Veldhoven, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 13
2019 · Marc van Veenhuizen, Dirk Looijmans, et al. · Microelectronics Reliability
Works count: 2
Citation count: 13
H-index: 1
I10-index: 1
Year
Topic
Type