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Muhammad Farhan Tayyab
Observed name:
Tayyab, Muhammad Farhan
Institution:
Valeo (Germany)
Observed institutions:
Chemnitz University of Technology,
Valeo (Germany),
Huawei Technologies (Germany)
OpenAlex ID:
A5036616428
Dynamic high temperature operating life test methodology for long-term switching reliability of GaN power devices
2022
·
Muhammad Farhan Tayyab
, Marco Silvestri
, et al.
·
Microelectronics Reliability
·
10
Investigation of the long-term dynamic RDS(on) variation and dynamic high temperature operating life test robustness of Schottky gate and ohmic gate GaN HEMT with comparable stress conditions
2025
·
Fawad Rauf
, Muhammad Farhan Tayyab
, et al.
·
Microelectronics Reliability
·
6
Methodology for designing and testing long-term Hard-switching for GaN power HEMT
2022
·
Muhammad Farhan Tayyab
, Marco Silvestri
, et al.
·
IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe)
·
3
Investigation of Benefits and Trade-offs of Integrating RC-Snubbers in SiC MOSFET based Power Modules for Automotive Applications
2026
·
Tayyab, Muhammad Farhan
, Bucher, Alexander
, et al.
·
Zenodo (CERN European Organization for Nuclear Research)
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Works count:
4
Citation count:
19
H-index:
3
I10-index:
1
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