Author

Kévin Jaouen

Observed names: Jaouen, K, Jaouen, Kevin, K Jaouen, K. Jaouen, Kevin Jaouen, Kévin Jaouen

Institutions: Centre National de la Recherche Scientifique, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, Université Paris-Saclay, CEA Paris-Saclay - Etablissement de Saclay, CEA Paris-Saclay, Nanosciences et Innovation pour les Matériaux, la Biomédecine et l'Énergie

Observed institutions: Centre National de la Recherche Scientifique, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, Université Paris-Saclay, CEA Paris-Saclay - Etablissement de Saclay, CEA Paris-Saclay, Nanosciences et Innovation pour les Matériaux, la Biomédecine et l'Énergie, King Abdullah University of Science and Technology

ORCID: 0000-0002-2213-4961

Observed ORCID: 0000-0002-2213-4961

OpenAlex ID: A5040164520

Rational design of reduced graphene oxide for superior performance of supercapacitor electrodes

2016 · S. Rasul, A. Alazmi, et al. · Carbon · 74

Backside absorbing layer microscopy: Watching graphene chemistry

2017 · Stéphane Campidelli, Refahi Abou Khachfe, et al. · Science Advances · 27

Localized electrochemistry for the investigation and the modification of 2D materials

2017 · K. Jaouen, O. Henrotte, et al. · Applied Materials Today · 19

Electronic Transport of MoS2 Monolayered Flakes Investigated by Scanning Electrochemical Microscopy

2017 · Olivier Henrotte, Thomas Bottein, et al. · ChemPhysChem · 15

Ideal optical contrast for 2D material observation using bi-layer antireflection absorbing substrates

2019 · Kevin Jaouen, Renaud Cornut, et al. · Nanoscale · 11

(Invited) Backside Absorbing Layer Microscopy: A New Tool to Study the Optical, Chemical and Electrochemical Properties of 2D Materials

2020 · Kevin Jaouen, Florian Lebon, et al. · ECS Meeting Abstracts · 3

(Invited) Backside Absorbing Layer Microscopy: A New Tool to Study the Optical, Chemical and Electrochemical Properties of 2D Materials

2021 · Kevin Jaouen, Nathan Ullberg, et al. · ECS Meeting Abstracts · 1

Mapping charge density in operating 2D transistors with high-contrast optical microscopy techniques

2025 · Ullberg, Nathan, Jaouen, Kevin, et al. · HAL

CVD-synthesis and local characterization of TMDC monolayers for electronics

2020 · Kévin Jaouen, Frédéric Lebon, et al. · HAL

Backside absorbing layer microscopy : a new tool for the investigation of 2D materials

2019 · Kévin Jaouen · theses.fr (ABES)

スーパーキャパシタ電極の優れた性能のための還元グラフェン酸化物の合理的設計【Powered by NICT】

2017 · S Rasul, A Alazmi, et al. · Carbon

Works count: 16

Citation count: 151

H-index: 5

I10-index: 5