2020 · Ihor Yakymenko, Mykhailo Kasianchuk, et al. · IEEE International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET) · 4
2002 · V.V. Fedorov, E.V. Dyomina, et al. · Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum · 1