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Rebecca Chen
Institutions:
NXP (Germany),
NXP (United States)
Observed institutions:
NXP (Germany),
NXP (United States)
ORCID:
0009-0002-1616-6075
Observed ORCID:
0009-0002-1616-6075
OpenAlex ID:
A5044103702
Data-Efficient Prediction of Minimum Operating Voltage via Inter- and Intra-Wafer Variation Alignment
2025
·
Yuxuan Yin
, Rebecca Chen
, et al.
·
IEEE VLSI Test Symposium (VTS)
·
2
PDF
Data-Efficient Conformalized Interval Prediction of Minimum Operating Voltage Capturing Process Variations
2024
·
Yuxuan Yin
, Rebecca Chen
, et al.
·
ACM/IEEE Design Automation Conference (DAC)
·
2
Wafer Map Pattern Recognition for Multisite Probe with Synthetic Data Augmented Training
2025
·
Chen He
, Rebecca Chen
, et al.
·
IEEE International Test Conference (ITC)
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Works count:
3
Citation count:
4
H-index:
2
I10-index:
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