Author

S. Aurite

Institution: Institute for Microelectronics and Microsystems

Observed institution: Institute for Microelectronics and Microsystems

OpenAlex ID: A5044682256

Crosstalk Characterization in Geiger-Mode Avalanche Photodiode Arrays

2008 · Emilio Sciacca, G. Condorelli, et al. · IEEE Electron Device Letters · 19

Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage

2007 · D. Corso, S. Aurite, et al. · Microelectronics Reliability · 7

Silicon Geiger mode avalanche photodiodes

2007 · M. Mazzillo, G. Condorelli, et al. · Optoelectronics Letters · 4

Works count: 3

Citation count: 30

H-index: 3

I10-index: 1