Author

Marek Škereň

Observed names: M Skeren, M Škereň, M. Škereň, Marek Skeren, Skeren, Marek
OpenAlex ID: A5050003371
2009 · Christian W.J. Berendsen, Marek Škereň, et al. · Applied Surface Science · 67
2013 · R Mokso, F Marone, et al. · Journal of Physics D Applied Physics · 58
2015 · R.J. Peláez, C.E. Rodríguez, et al. · Surface and Coatings Technology · 13
2004 · David Engström, Sverker Hård, et al. · Applied Optics · 11
2000 · Marek Skeren, Ivan Richter, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
2013 · J Svoboda, M Škereň, et al. · Journal of Physics Conference Series · 8
2010 · Jiří Bulír, Michal Novotný, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2014 · R J Peláez, C N Afonso, et al. · Nanotechnology · 6
2013 · M Škereň, M Nývlt, et al. · Journal of Physics Conference Series · 4
2003 · David Engstrom, Sverker Hard, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2015 · RJ Peláez, CN Afonso, et al. · Nanotechnology · 3
2012 · Marek Škereň, Jakub Svoboda, et al. · Journal of the European Optical Society Rapid Publications · 3
2004 · Marek Skeren, Ivan Richter, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
2002 · Marek Skeren, Ivan Richter, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
2017 · R. J. Peláez, A. Ferrero, et al. · RSC Advances · 2
2016 · Jaroslav Čech, Petr Haušild, et al. · Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum · 2
2015 · R.J. Peláez, C.N. Afonso, et al. · Applied Surface Science · 2
2015 · Martin Possolt, Marek Škereň, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2011 · Jakub Svoboda, Marek Skeren, et al. · InTech eBooks · 2
2011 · T. Jindra, J. Dušek, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2006 · Ondřej Komenda, Marek Škereň · Frontiers in Optics · 2
2001 · Marek Skeren, Ivan Richter, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2015 · Pavel Hartman, Marek Škereň · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Works count: 51
Citation count: 233
H-index: 7
I10-index: 4
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