Author

Christopher W. Szakal

Observed names: C Szakal, C. SZAKAL, C. Szakal, Christopher Szakal

Institutions: National Institute of Standards and Technology, Material Measurement Laboratory

Observed institutions: Micron (United States), Pennsylvania State University, National Institute of Standards and Technology, Los Alamos National Laboratory, Material Measurement Laboratory, Muhlenberg College, University of Duisburg-Essen

ORCID: 0000-0002-2050-9619

Observed ORCID: 0000-0002-2050-9619

OpenAlex ID: A5060412705

Measurement of Nanomaterials in Foods: Integrative Consideration of Challenges and Future Prospects

2014 · Christopher Szakal, Stephen M. Roberts, et al. · ACS Nano · 134

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Molecular Depth Profiling of Histamine in Ice Using a Buckminsterfullerene Probe

2004 · Andreas Wucher, Shixin Sun, et al. · Analytical Chemistry · 90

Improvements in SIMS continue

2006 · Nicholas Winograd, Zbigniew Postawa, et al. · Applied Surface Science · 70

Secondary Ion MS Imaging of Lipids in Picoliter Vials with a Buckminsterfullerene Ion Source

2005 · Sara G. Ostrowski, Christopher Szakal, et al. · Analytical Chemistry · 70

Sputtering Yields for C60 and Au3 Bombardment of Water Ice as a Function of Incident Kinetic Energy

2007 · Michael F. Russo, Christopher Szakal, et al. · Analytical Chemistry · 69

C60 molecular depth profiling of a model polymer

2004 · C. Szakal, S. Sun, et al. · Applied Surface Science · 61

Surface Sensitivity in Cluster-Ion-Induced Sputtering

2006 · Christopher Szakal, Joseph Kozole, et al. · Physical Review Letters · 58

Use of C 60 cluster projectiles for sputter depth profiling of polycrystalline metals

2004 · S. Sun, C. Szakal, et al. · Surface and Interface Analysis · 56

Compositional Mapping of the Surface and Interior of Mammalian Cells at Submicrometer Resolution

2011 · Christopher Szakal, Kedar Narayan, et al. · Analytical Chemistry · 45

Depth profiling studies of multilayer films with a C60+ ion source

2004 · A.G. Sostarecz, S. Sun, et al. · Applied Surface Science · 45

Depth profiling of polycrystalline multilayers using aBuckminsterfullerene projectile

2004 · S. Sun, A. Wucher, et al. · Applied Physics Letters · 41

Molecule-Specific Imaging with Mass Spectrometry and a Buckminsterfullerene Probe: Application to Characterizing Solid-Phase Synthesized Combinatorial Libraries

2004 · Jiyun Xu, Christopher W. Szakal, et al. · Journal of the American Chemical Society · 41

ToF-SIMS imaging with cluster ion beams

2004 · J. Xu, S. Ostrowski, et al. · Applied Surface Science · 40

Energetic ion bombardment of Ag surfaces by C60+ and Ga+ projectiles

2005 · Shixin Sun, Christopher Szakal, et al. · Journal of the American Society for Mass Spectrometry · 32

Sputtering of Ag under C60+ and Ga+ projectile bombardment

2004 · S. Sun, C. Szakal, et al. · Applied Surface Science · 29

Advances in age-dating of individual uranium particles by large geometry secondary ion mass spectrometry

2019 · Christopher Szakal, David S. Simons, et al. · The Analyst · 28

Automated correlation and classification of secondary ion mass spectrometry images using a k-means cluster method

2012 · Andrew R. Konicek, Jonathan Lefman, et al. · The Analyst · 27

Measurement Methods for the Oral Uptake of Engineered Nanomaterials from Human Dietary Sources: Summary and Outlook

2014 · Christopher Szakal, Lyubov Tsytsikova, et al. · Comprehensive Reviews in Food Science and Food Safety · 26

Molecular depth profiling in ice matrices using C60 projectiles

2004 · A. Wucher, S. Sun, et al. · Applied Surface Science · 26

Analysis and Mechanisms of Cyclotrimethylenetrinitramine Ion Formation in Desorption Electrospray Ionization

2009 · Christopher Szakal, Tim M. Brewer · Analytical Chemistry · 25

Ion Emission from Water Ice Due to Energetic Particle Bombardment

2004 · Igor A. Wojciechowski, Shixin Sun, et al. · The Journal of Physical Chemistry A · 25

Model multilayer structures for three-dimensional cell imaging

2006 · Joseph Kozole, Christopher Szakal, et al. · Applied Surface Science · 23

Mechanical properties and the evolution of matrix molecules in PTFE upon irradiation with MeV alpha particles

2006 · Gregory L. Fisher, Rollin E. Lakis, et al. · Applied Surface Science · 21

Emission of ionic water clusters from water ice films bombarded by energetic projectiles

2004 · Igor A. Wojciechowski, Uchkun Kutliev, et al. · Applied Surface Science · 17

Fundamental studies of the cluster ion bombardment of water ice

2006 · Christopher Szakal, Joseph Kozole, et al. · Applied Surface Science · 16

Works count: 44

Citation count: 1,204

H-index: 22

I10-index: 30