Author

Bret Schrayer

OpenAlex ID: A5061762425

Recent Progress in Non-Contact Electrical Characterization for SiC and Related Compounds

2023 · Alexandre Savtchouk, Marshall Wilson, et al. · Materials science forum · 3

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Characterization Of Gallium Oxide With A Novel Non-Contact Electrical Metrology, CnCV, For Wide Bandgap Semiconductors

2022 · Marshall Wilson, Dmitriy Marinskiy, et al. · ECS Transactions · 2

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Characterization Of Gallium Oxide With A Novel Non-Contact Electrical Metrology, CnCV, For Wide Bandgap Semiconductors

2022 · Marshall Wilson, Dmitriy Marinskiy, et al. · ECS Meeting Abstracts · 1

Piezoelectric modulation of surface voltage in GaN and AlGaN/GaN: charge screening effects and 2DEG

2017 · Marshall Wilson, Bret Schrayer, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1

Novel Noncontact Enhanced Throughput Electrical Characterization for AlGaN/GaN HEMT Technology

2024 · Marshall Wilson, Dmitriy Marinskiy, et al.

Practical Improvement of Noncontact Production Monitoring of Doping in SiC Wafers with Extended Epilayer Defects

2024 · Alexandre Savtchouk, Marshall Wilson, et al. · Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum

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Ultra-High Sensitivity Surface Photovoltage Measurement of Heavy Metal Contamination in Silicon Wafers with Fast Metal Identification

2018 · Marshall Wilson, Alexandre Savtchouk, et al. · ECS Meeting Abstracts

Ultra-High Sensitivity Surface Photovoltage Measurement of Heavy Metal Contamination in Silicon Wafers with Fast Metal Identification

2018 · Marshall Wilson, Alexandre Savtchouk, et al. · ECS Transactions

Works count: 8

Citation count: 7

H-index: 2

I10-index: