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Ruth Muenstermann
Observed names:
R. Muenstermann,
Ruth Münstermann
Institutions:
Forschungszentrum Jülich,
Jülich Aachen Research Alliance
Observed institutions:
Hewlett-Packard (United States),
Forschungszentrum Jülich,
Ernst Ruska Centre,
Jülich Aachen Research Alliance,
RWTH Aachen University
OpenAlex ID:
A5065676089
Coexistence of Filamentary and Homogeneous Resistive Switching in Fe‐Doped SrTiO 3 Thin‐Film Memristive Devices
2010
·
Ruth Muenstermann
, Tobias Menke
, et al.
·
Advanced Materials
·
366
Scaling Potential of Local Redox Processes in Memristive SrTiO $_{3}$ Thin-Film Devices
2012
·
Regina Dittmann
, Ruth Muenstermann
, et al.
·
Proceedings of the IEEE
·
70
Morphological and electrical changes in TiO2 memristive devices induced by electroforming and switching
2009
·
Ruth Münstermann
, J. Joshua Yang
, et al.
·
physica status solidi (RRL) - Rapid Research Letters
·
70
Structural and chemical characterization of TiO2memristive devices by spatially-resolved NEXAFS
2009
·
John Paul Strachan
, J Joshua Yang
, et al.
·
Nanotechnology
·
65
PDF
Realization of regular arrays of nanoscale resistive switching blocks in thin films of Nb-doped SrTiO3
2008
·
Ruth Muenstermann
, Regina Dittmann
, et al.
·
Applied Physics Letters
·
59
PDF
Detection of filament formation in forming-free resistive switching SrTiO3 devices with Ti top electrodes
2012
·
S. Stille
, Ch. Lenser
, et al.
·
Applied Physics Letters
·
57
PDF
Correlation between growth kinetics and nanoscale resistive switching properties of SrTiO3 thin films
2010
·
Ruth Muenstermann
, Tobias Menke
, et al.
·
Journal of Applied Physics
·
55
PDF
Bipolar resistive switching in oxides: Mechanisms and scaling
2011
·
Rainer Bruchhaus
, Ruth Muenstermann
, et al.
·
Current Applied Physics
·
14
Poster: Advances in Technology and Characterization
2012
·
S. Stille
, Ch. Lenser
, et al.
·
Frontiers in Electronic Materials
Nanosession: Valence Change Memories ‐ A Look Inside
2012
·
R. Dittmann
, R. Muenstermann
, et al.
·
Frontiers in Electronic Materials
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Works count:
10
Citation count:
756
H-index:
8
I10-index:
8
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