Author

Dieter Schaefer

Observed names: D. A. Schaefer, D. Schaefer, D.A. Schaefer, Schaefer, D.
Institution: Towson University
OpenAlex ID: A5069339092
1997 · Eberhard Welsch, K. Ettrich, et al. · Optical Engineering · 35
2004 · Henrik Ehlers, Karl-Josef Becker, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 17
1995 · F.A. Chudnovskii, A.L. Pergament, et al. · Journal of Solid State Chemistry · 13
1992 · Zhouling Wu, Michael Reichling, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 12
1991 · Christel Budziuski, Ruediger Grunwald, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
1992 · Zhouling Wu, Michael Reichling, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
1996 · F. A. Chudnovskii, A. L. Pergament, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
1994 · Michael Reichling, J. Siegel, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
1992 · Zhouling Wu, Zhengxiu Fan, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
1992 · Zhouling Wu, Javier Jauregui, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
1996 · K. Ettrich, Holger Blaschke, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
2007 · V. N. Smolyaninova, E. Talanova, et al. · Applied Physics Letters
1994 · Dieter Schaefer, Peter Thomsen-Schmidt, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
1993 · Dieter Schaefer, V. Guepner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
1992 · Reinhard Wolf, A. Fischer, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 16
Citation count: 112
H-index: 6
I10-index: 4
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