Author

Sean Pearson

Observed names: Pearson, Sean, S. Pearson
Observed institution: Sandia National Laboratories
OpenAlex ID: A5072045874
2002 · R.M.A. Dawson, Z. Shen, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 177
1998 · R. M. A. Dawson, Z. Shen, et al. · SID Symposium Digest of Technical Papers · 104
1999 · R. M. A. Dawson, Z. Shen, et al. · SID Symposium Digest of Technical Papers · 41
2002 · R.M.A. Dawson, M.G. Kane, et al. · IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS) · 7
2012 · J. Teifel, R. S. Flores, et al. · IEEE Aerospace Conference (AERO) · 5
2002 · Roger Stewart, Anne Chiang, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2002 · Jeffrey Jacobsen, Anne Chiang, et al. · SID Symposium Digest of Technical Papers · 4
2009 · Murat Okandan, Roy Olsson, et al. · IEEE International Conference on Micro Electro Mechanical Systems (MEMS) · 2
2006 · M. Okandan, B. Draper, et al. · IEEE International SOI Conference (SOI) · 1
1999 · S‐S. Sun, M. S. Bowen, et al. · SID Symposium Digest of Technical Papers · 1
2020 · Pearson, Sean · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
2015 · Jeffrey D. Black, Nathaniel A. Dodds, et al. · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
2013 · John Teifel, Richard S. Flores, et al. · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
2009 · Paiboon Tangyunyong, Rick McFarland, et al. · Proceedings - International Symposium for Testing and Failure Analysis
Works count: 15
Citation count: 346
H-index: 5
I10-index: 3
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