Author

Krzysztof Patorski

Observed names: K Patorski, K. Patorski, Krzysztof Patorski (3958640), Patorski, K., Patorski, Krzysztof

Institution: Warsaw University of Technology

Observed institutions: Warsaw University of Technology, National Institute of Astrophysics, Optics and Electronics, Institutul de Fizică Atomică, Virginia Tech, The University of Osaka

ORCID: 0000-0001-5197-3118

Observed ORCID: 0000-0001-5197-3118

OpenAlex ID: A5076845708

I The Self-Imaging Phenomenon and its Applications

1989 · Krzysztof Patorski · Progress in optics · 450

Handbook of the moiré fringe technique

1993 · Krzysztof Patorski · 159

Advanced processing of optical fringe patterns by automated selective reconstruction and enhanced fast empirical mode decomposition

2013 · Maciej Trusiak, Maciej Wielgus, et al. · Optics and Lasers in Engineering · 118

Adaptive enhancement of optical fringe patterns by selective reconstruction using FABEMD algorithm and Hilbert spiral transform

2012 · Maciej Trusiak, Krzysztof Patorski, et al. · Optics Express · 77

Single shot fringe pattern phase demodulation using Hilbert-Huang transform aided by the principal component analysis

2016 · Maciej Trusiak, Łukasz Służewski, et al. · Optics Express · 69

Two-shot fringe pattern phase-amplitude demodulation using Gram-Schmidt orthonormalization with Hilbert-Huang pre-filtering

2015 · Maciej Trusiak, Krzysztof Patorski · Optics Express · 67

Incoherent Superposition of Multiple Self-imaging Lau Effect and Moiré Fringe Explanation

1983 · K. Patorski · Optica Acta International Journal of Optics · 66

Quantitative phase imaging by single-shot Hilbert–Huang phase microscopy

2016 · Maciej Trusiak, Vicente Mico, et al. · Optics Letters · 64

Evaluation of amplitude encoded fringe patterns using the bidimensional empirical mode decomposition and the 2D Hilbert transform generalizations

2011 · M. Wielgus, K. Patorski · Applied Optics · 58

Collimation test by double grating shearing interferometer

1976 · Krzysztof Patorski, Shunsuke Yokozeki, et al. · Applied Optics · 57

Variational Hilbert Quantitative Phase Imaging

2020 · Maciej Trusiak, Maria Cywińska, et al. · Scientific Reports · 55

PDF

Collimation method using fourier imaging and moire techniques

1975 · S. Yokozeki, K. Patorski, et al. · Optics Communications · 52

Optically-sectioned two-shot structured illumination microscopy with Hilbert-Huang processing

2014 · Krzysztof Patorski, Maciej Trusiak, et al. · Optics Express · 51

Hilbert-Huang processing for single-exposure two-dimensional grating interferometry

2013 · Maciej Trusiak, Krzysztof Patorski, et al. · Optics Express · 46

Geometric parameters of moiré fringes

1976 · S. Yokozeki, Y. Kusaka, et al. · Applied Optics · 44

Separation of complex fringe patterns using two-dimensional continuous wavelet transform

2012 · Krzysztof Pokorski, Krzysztof Patorski · Applied Optics · 43

Visualization of additive-type moiré and time-average fringe patterns using the continuous wavelet transform

2010 · Krzysztof Pokorski, Krzysztof Patorski · Applied Optics · 41

Fraunhofer Diffraction Patterns of Titled Planar Objects

1983 · K. Patorski · Optica Acta International Journal of Optics · 41

Fourier domain interpretation of real and pseudo-moiré phenomena

2011 · Krzysztof Patorski, Krzysztof Pokorski, et al. · Optics Express · 39

Simultaneous extraction of phase and phase shift from two interferograms using Lissajous figure and ellipse fitting technology with Hilbert–Huang prefiltering

2016 · Fengwei Liu, Jing Wang, et al. · Journal of Optics · 38

Automatized fringe pattern preprocessing using unsupervised variational image decomposition

2019 · Maria Cywińska, Maciej Trusiak, et al. · Optics Express · 36

Hilbert–Huang single-shot spatially multiplexed interferometric microscopy

2018 · José Ángel Picazo-Bueno, Maciej Trusiak, et al. · Optics Letters · 35

Two-frame tilt-shift error estimation and phase demodulation algorithm

2015 · Maciek Wielgus, Zofia Sunderland, et al. · Optics Letters · 35

Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination

2007 · Adam Styk, Krzysztof Patorski · Applied Optics · 35

Active microelement testing by interferometry using time-average and quasi-stroboscopic techniques

2003 · Leszek A. Salbut, Krzysztof Patorski, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 35

Works count: 233

Citation count: 3,104

H-index: 30

I10-index: 82