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Giuseppe Sciuto

Observed name: Sciuto, Giuseppe
Observed institution: STMicroelectronics (Italy)
OpenAlex ID: A5080098991
A Multiscale and Multimodal Correlative Microscopy Workflow to Characterize Copper Segregations Identified in Epitaxial Layer of Power MOSFETs
2023 · Flavio Cognigni, Marco Rossi, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2
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New Approach in Physical Failure Analysis Based on 3D Reconstruction
2022 · Domenico Mello, Giuseppe Sciuto, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2
Multiphysics Reliability Analysis of Degradation Mechanisms in GaN HEMTs: An in Situ Diagnostic Approach
2026 · Moreno d'Ambrosio, Chiara Tripodi, et al. · IEEE Transactions on Power Electronics
Top-Down Junction Analysis in SiC
2024 · Gregory M. Johnson, Andreas Rummel, et al. · Proceedings - International Symposium for Testing and Failure Analysis
Works count: 5
Citation count: 3
H-index: 1
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