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Marc Ayel
Observed institution:
Université Savoie Mont Blanc
OpenAlex ID:
A5081395620
SACCO-SYCOJET: two different ways of verifying knowledge-based systems
1991
·
Marc Ayel
, Jean-Pierre Laurent
·
John Wiley & Sons, Inc. eBooks
·
20
SYCOJET and SACCO, two tools for verifying expert systems
1993
·
Marc Ayel
, Laurence Vignollet
·
17
Protocols for Consistency Checking in Expert System Knowledge Bases.
1988
·
Marc Ayel
·
European Conference on Artificial Intelligence
·
11
A conceptual model for building sets of test samples for knowledge bases
1990
·
Laurence Vignollet
, Marc Ayel
·
European Conference on Artificial Intelligence
·
5
Verification and Validation of Knowledge Based Systems
1996
·
Marc Ayel
·
Springer eBooks
·
3
PDF
A Conceptual Model for Consistency of Knowledge Bases.
1988
·
Marc Ayel
·
Artificial Intelligence: Methodology, Systems, Applications
·
2
Datum discovery
1997
·
Laurent Siklóssy
, Marc Ayel
·
Lecture notes in computer science
·
1
Mutants in the KBS Testing Process
1995
·
Marc Ayel
, Ruth Stalker
·
1
Complexity of Rulebases.
2000
·
Fernándo Alonso-Martín
, Marc Ayel
A Symbolic Execution Based Approach for Inspecting Knowledge Bases.
1997
·
Amar Bendou
, Marc Ayel
Completeness of Knowledge-based Systems.
1995
·
R. Lounis
, Marc Ayel
Verifying Coherence in Modular Knowledge Bases.
1995
·
Bruno Wendler
, Marc Ayel
Un schéma abductif pour la vérification dynamique des bases de connaissances floues
1994
·
D. Kinkielélé
, Marc Ayel
Consistency and Rules Subject to Exceptions.
1991
·
Stéphane Talbot
, Marc Ayel
A Model for Testing Knowledge Bases.
1990
·
Laurence Vignollet
, Marc Ayel
·
Proceedings/Proceedings of the ... International Conference on Software Engineering and Knowledge Engineering
SYCOJET: a tool for building automatically sets of test for knowledge bases
1990
·
Laurence Vignollet
, Marc Ayel
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Coherence Testing Of Knowledge Bases
1989
·
Marc Ayel
, Jean P. Laurent
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
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Works count:
18
Citation count:
60
H-index:
4
I10-index:
3
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