Author

Angela Duparré

Observed names: A DUPARRE, A Duparré, A. Duparre, A. Duparré, Angela DUPARRÉ, Angela Duparre, Duparre, A., Duparre, Angela, Duparré, A., Duparré, Angela

Observed institutions: P.N. Lebedev Physical Institute of the Russian Academy of Sciences, Technische Universität Ilmenau, Uppsala University, Lomonosov Moscow State University, Technische Universität Darmstadt, Laser Zentrum Hannover, Fraunhofer Institute for Applied Optics and Precision Engineering, Fraunhofer-Gesellschaft, Universitat de Barcelona, Friedrich Schiller University Jena, Foundation for Research and Technology Hellas

OpenAlex ID: A5082015403

Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components

2002 · Angela Duparré, Josep Ferre-Borrull, et al. · Applied Optics · 386

PDF

Total integrated scatter from surfaces with arbitrary roughness, correlation widths, and incident angles

2012 · James E. Harvey, Narak Choi, et al. · Optical Engineering · 194

Modeling of light scattering in different regimes of surface roughness

2011 · Sven Schröder, Angela Duparré, et al. · Optics Express · 184

Angle-resolved scattering: an effective method for characterizing thin-film coatings

2010 · Sven Schröder, Tobias Herffurth, et al. · Applied Optics · 93

Ultraviolet optical and microstructural properties of MgF_2 and LaF_3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation

2002 · Detlev Ristau, Stefan Günster, et al. · Applied Optics · 89

PDF

Metal mirrors with excellent figure and roughness

2008 · R. Steinkopf, A. Gebhardt, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 83

Relation between light scattering and the microstructure of optical thin films

1993 · Angela Duparré, Samer Kassam · Applied Optics · 74

Roughness analysis of optical films and substrates by atomic force microscopy

1996 · C. Ruppe, A. Duparré · Thin Solid Films · 68

Procedure to characterize microroughness of optical thin films: application to ion-beam-sputtered vacuum-ultraviolet coatings

2001 · Josep Ferré-Borrull, Angela Duparré, et al. · Applied Optics · 67

PDF

Light scattering from the volume of optical thin films: theory and experiment

1992 · Samer Kassam, Angela Duparré, et al. · Applied Optics · 64

Comprehensive nanostructure and defect analysis using a simple 3D light-scatter sensor

2013 · Tobias Herffurth, Sven Schröder, et al. · Applied Optics · 63

Open questions in surface topography measurement: a roadmap

2015 · Richard Leach, Christopher Evans, et al. · Surface Topography Metrology and Properties · 62

Evaluation of subsurface damage by light scattering techniques

2013 · Marcus Trost, Tobias Herffurth, et al. · Applied Optics · 57

Instrument for close-to-process light scatter measurements of thin film coatings and substrates

2011 · Alexander von Finck, Matthias Hauptvogel, et al. · Applied Optics · 49

Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films

2002 · Alexander V. Tikhonravov, Michael K. Trubetskov, et al. · Applied Optics · 47

Effects of interface roughness on the spectral properties of thin films and multilayers

2003 · Alexander V. Tikhonravov, Michael K. Trubetskov, et al. · Applied Optics · 44

Protected and enhanced aluminum mirrors for the VUV

2013 · S. Wilbrandt, O. Stenzel, et al. · Applied Optics · 43

Influence of the substrate finish and thin film roughness on the optical performance of Mo/Si multilayers

2010 · Marcus Trost, Sven Schröder, et al. · Applied Optics · 43

Interfacial roughness and related scatter in ultraviolet optical coatings: a systematic experimental approach

1998 · Stefan Jakobs, Angela Duparré, et al. · Applied Optics · 43

Optical coatings with enhanced roughness for ultrahydrophobic, low-scatter applications

2002 · Angela Duparré, Marcel Flemming, et al. · Applied Optics · 40

Angle-resolved scattering and reflectance of extreme-ultraviolet multilayer coatings: measurement and analysis

2010 · Sven Schröder, Tobias Herffurth, et al. · Applied Optics · 39

Spectral angle resolved scattering of thin film coatings

2013 · Sven Schröder, David Unglaub, et al. · Applied Optics · 38

Measurement system to determine the total and angle-resolved light scattering of optical components in the deep-ultraviolet and vacuum-ultraviolet spectral regions

2005 · Sven Schröder, Stefan Gliech, et al. · Applied Optics · 37

Standardization of light scattering measurements

2015 · Sven Schröder, Alexander von Finck, et al. · Advanced Optical Technologies · 36

Origins of light scattering from thin film coatings

2015 · Sven Schröder, Marcus Trost, et al. · Thin Solid Films · 36

Works count: 254

Citation count: 3,230

H-index: 29

I10-index: 70