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K. Ozard
Institution:
Nortel (Canada)
Observed institution:
Nortel (Canada)
OpenAlex ID:
A5082801749
Experimental analysis of microwave loss due to substrate carrier concentration in traveling-wave electro-optic modulators
1998
·
H. R. Khazaei
, O. Berolo
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
Charge carrier effect on the microwave losses observed on traveling-wave electrodes used in electro-optic modulators
1998
·
H. R. Khazaei
, O. Berolo
, et al.
·
Microwave and Optical Technology Letters
·
2
The relationship between the resistivity of semi-insulating GaAs and MESFET properties
1997
·
Carla Miner
, J. Zorzi
, et al.
·
Materials Science and Engineering B
·
1
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Works count:
3
Citation count:
5
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2
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