Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Younghoon Ban
Observed name:
YoungHoon Ban
Institution:
Soongsil University
Observed institution:
Soongsil University
ORCID:
0000-0002-1759-9668
Observed ORCID:
0000-0002-1759-9668
OpenAlex ID:
A5082863218
MAPAS: a practical deep learning-based android malware detection system
2022
·
Jinsung Kim
, Younghoon Ban
, et al.
·
International Journal of Information Security
·
135
PDF
FAM: Featuring Android Malware for Deep Learning-Based Familial Analysis
2022
·
Younghoon Ban
, Sunjun Lee
, et al.
·
IEEE Access
·
17
PDF
An Empirical Study on the Effectiveness of Adversarial Examples in Malware Detection
2024
·
Younghoon Ban
, Myeonghyun Kim
, et al.
·
Computer Modeling in Engineering & Sciences
·
8
PDF
Augmenting Android Malware Using Conditional Variational Autoencoder for the Malware Family Classification
2023
·
Younghoon Ban
, Jeong Hyun Yi
, et al.
·
Computer Systems Science and Engineering
·
6
PDF
ACAMA: Deep Learning-Based Detection and Classification of Android Malware Using API-Based Features
2021
·
Eunbyeol Ko
, Jinsung Kim
, et al.
·
Security and Communication Networks
·
5
PDF
Ventinel: Automated Detection of Android Vishing Apps Using Optical Character Recognition
2025
·
Deagyeom Kim
, Sehwan O
, et al.
·
Future Internet
·
3
PDF
LiDAR: A Light‐Weight Deep Learning‐Based Malware Classifier for Edge Devices
2022
·
Jinsung Kim
, Younghoon Ban
, et al.
·
Wireless Communications and Mobile Computing
·
1
PDF
Threat Models and Evaluation Conditions in LLM Security Research: A Comparative Analysis, 2023-2026
2026
·
YoungHoon Ban
, Se-Yul Lee
·
Journal of the Korea Academia-Industrial cooperation Society
RAVEN: Measuring Detection Instability in Anti-virus Engines under Semantics-Preserving Perturbations
2026
·
Younghoon Ban
, Beomjin Jin
, et al.
·
IEEE/ACM International Conference on Automated Software Engineering (ASE)
PDF
Xades: Static Taint Analysis Framework for C#-Based Multilingual Applications
2025
·
O. Sehwan
, Minho Kim
, et al.
·
IEEE Access
Show more works
View as search
Works count:
10
Citation count:
175
H-index:
5
I10-index:
2
Year
Topic
Type