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Author

G. Senko

Observed institution: Alcatel-Lucent (France)
OpenAlex ID: A5083235653
Metrology and methodology of system level ESD testing
2002 · D. Lin, D. Pommerenke, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 20
Works count: 1
Citation count: 20
H-index: 1
I10-index: 1
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