Author

Richard D. Peters

2001 · David S. Fryer, Richard D. Peters, et al. · Macromolecules · 509
2000 · Xiao M. Yang, Richard D. Peters, et al. · Macromolecules · 154
2000 · Richard D. Peters, Xiao M. Yang, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 63
2000 · Tae K. Kim, Xiao M. Yang, et al. · The Journal of Physical Chemistry B · 52
2007 · Jason C. White, Richard Peters, et al. · Environmental Science & Technology · 37
1999 · Xiao M. Yang, Richard D. Peters, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 32
2010 · Jason W. Kelsey, Ilya B. Slizovskiy, et al. · Environmental Pollution · 31
1981 · J. H. Westsik, R. D. Peters · Springer eBooks · 29
1982 · R.D. Peters, S.C. Slate · Nuclear Engineering and Design · 25
2003 · S. Postnikov, S. Hector, et al. · Microelectronic Engineering · 23
1978 · R.L. Filler, J.M. Frank, et al. · Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS) · 20
1976 · R.D. Peters · Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS) · 17
1995 · M. I. Onsøien, Richard D. Peters, et al. · Welding Journal · 14
1983 · William L. Kuhn, Richard D. Peters, et al. · Nuclear Technology · 14
1996 · Jang‐Hi Im, Edward O. Shaffer, et al. · SPIE eBooks · 13
2002 · A. Frey, F. Hofmann, et al. · Microelectronics Reliability · 12
1982 · William L. Kuhn, Richard D. Peters · MRS Proceedings · 12
2006 · Phillip J. Stout, Shahid Rauf, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 8
2002 · Jonathan L. Cobb, S. Dakshina-Murthy, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2005 · Patrick K. Montgomery, Richard Peters, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
Works count: 73
Citation count: 1,619
H-index: 17
I10-index: 22
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