Get started
Author

D. Nee

Observed names: D Née, Didier Nee
OpenAlex ID: A5083402140
Temperature and drain voltage dependence of gate-induced drain leakage
2004 · L Lopez, P Masson, et al. · Microelectronic Engineering · 17
EEPROM memory: threshold voltage built in self diagnosis
2004 · J.M. Portal, H. Aziza, et al. · IEEE International Test Conference (ITC) · 12
Floating-gate EEPROM cell model based on MOS model 9
2003 · J.M. Portal, L. Forli, et al. · IEEE International Symposium on Circuits and Systems proceedings · 12
EEPROM Compact Model with SILC Simulation Capability
2006 · A. Regnier, J.M. Portal, et al. · Non-Volatile Memory Technology Symposium · 11
Test Structure for Process and Product Evaluation
2007 · F. Rigaud, J.M. Portal, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 7
An automated methodology to diagnose geometric defect in the EEPROM cell
2003 · J.M. Portal, L. Forli, et al. · IEEE International Test Conference (ITC) · 4
Peripheral Circuitry Impact on LEPROM Threshold Voltage
2007 · H. Aziza, J.M. Portal, et al. · Non-Volatile Memory Technology Symposium · 3
Speeding up simulation time in EEPROM memory designs
2006 · H. Aziza, B. Delsuc, et al. · International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) · 3
Mixed test structure for soft and hard defect detection
2008 · F. Rigaud, J. M. Portal, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 2
A New Embedded Measurement Structure for eDRAM Capacitor
2005 · L. Lopez, J.M. Portal, et al. · Design, Automation, and Test in Europe · 2
PDF
Flash memory cell diagnosis: high level model
2005 · J.M. Portal, B. Saillet, et al. · IEEE Computational Systems Bioinformatics Conference (CSB) · 2
An automated design methodology for EEPROM cell (ADE)
2003 · J.M. Portal, L. Forli, et al. · Records of the IEEE International Workshop on Memory Technology, Design, and Testing · 1
Back-end soft and hard defect monitoring using a single test chip
2011 · Fabrice Rigaud, Jean-Michel Portal, et al. · Microelectronics Reliability
Flash memory cell: parametric test data reconstruction for process monitoring
2006 · B. Saillet, J.M. Portal, et al. · Proceedings
EEPROMCompact ModelwithSILCSimulation Capability
2006 · A. Régnier, J.M. Portal, et al.
Test chip and infrastructure IP solutions to improve the back-end process during all phases from a new technology development to manufacturing
2005 · L. Forli, J.M. Portal, et al. · International Caribbean Conference on Devices, Circuits and Systems
A low cost test vehicle for embedded DRAM capacitor: Investigation and monitoring of the process
2004 · L. Lopez, D. Nee, et al. · IEEE International Reliability Physics Symposium proceedings
Floating-gate EEPROM cell: threshold voltage sensibility to geometry
2003 · J.M. Portal, L. Forli, et al. · IEEE International Symposium on Circuits and Systems proceedings
Works count: 18
Citation count: 76
H-index: 5
I10-index: 4
Year
Topic
Type