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Christoph Wilhelmer

Observed names: C. Wilhelmer, Wilhelmer, Christoph
ORCID: 0000-0002-9996-2589
Observed ORCID: 0000-0002-9996-2589
OpenAlex ID: A5085874744
Ab initio investigations in amorphous silicon dioxide: Proposing a multi-state defect model for electron and hole capture
2022 · Christoph Wilhelmer, Dominic Waldhoer, et al. · Microelectronics Reliability · 40
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A stochastic encoder using point defects in two-dimensional materials
2024 · Harikrishnan Ravichandran, Theresia Knobloch, et al. · Nature Communications · 24
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Machine learning interatomic potential for silicon-nitride (Si3N4) by active learning
2023 · Diego Milardovich, Christoph Wilhelmer, et al. · The Journal of Chemical Physics · 23
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Over- and Undercoordinated Atoms as a Source of Electron and Hole Traps in Amorphous Silicon Nitride (a-Si3N4)
2023 · Christoph Wilhelmer, Dominic Waldhoer, et al. · Nanomaterials · 21
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Dynamic modeling of Si(100) thermal oxidation: Oxidation mechanisms and realistic amorphous interface generation
2022 · Lukas Cvitkovich, Dominic Waldhör, et al. · Applied Surface Science · 20
Theoretical insights into the impact of border and interface traps on hysteresis in monolayer MoS2 FETs
2025 · Rittik Ghosh, Alexandros Provias, et al. · Microelectronic Engineering · 19
X-ray Fluorescence Techniques for Element Abundance Analysis in Wine
2021 · Jasmina Obhod̵aš, Vladivoj Valković, et al. · ACS Omega · 13
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Polaron formation in the hydrogenated amorphous silicon nitride Si 3 N 4 : H
2024 · Christoph Wilhelmer, Dominic Waldhör, et al. · Physical review. B./Physical review. B · 12
Coherence limit due to hyperfine interaction with nuclei in the barrier material of Si spin qubits
2024 · Lukas Cvitkovich, Peter Stano, et al. · Physical Review Applied · 8
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Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO 2 Network
2021 · Christoph Wilhelmer, Markus Jech, et al. · IEEE European Solid-State Device Research Conference (ESSDERC) · 5
Intrinsic Electron Trapping in Amorphous Silicon Nitride (a-Si3N4:H)
2023 · Christoph Wilhelmer, Dominic Waldhoer, et al. · International Conference on Simulation of Semiconductor Processes and Devices · 4
Machine learning force field for thermal oxidation of silicon
2024 · Lukas Cvitkovich, Franz Fehringer, et al. · The Journal of Chemical Physics · 3
Metastability of Negatively Charged Hydroxyl-E’ Centers and their Potential Role in Positive Bias Temperature Instabilities
2022 · Christoph Wilhelmer, Dominic Waldhoer, et al. · IEEE European Solid-State Device Research Conference (ESSDERC) · 3
Valley splitting in Si/SiGe heterostructures from first principles
2026 · Lukas Cvitkovich, Tancredi Salamone, et al. · Physical review. B./Physical review. B · 2
Optical properties of vacancies in aluminum oxide ( α − Al 2 O 3 ) from first principles
2025 · Christoph Wilhelmer, Mark E. Turiansky, et al. · Physical Review Materials · 2
Efficient Quantum-Mechanical Modeling of Nonradiative Charge Transfer Processes
2026 · Karl, Alexander, Waldhoer, Dominic, et al. · arXiv (Cornell University) · 1
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Modeling the Impact of Interface and Border Traps on Hysteresis in Encapsulated Monolayer MoS2 Based Double Gated FETs
2024 · Rittik Ghosh, Theresia Knobloch, et al. · Austrochip Workshop on Microelectronics (Austrochip) · 1
Variability in Si/SiGe and Si/SiO2 Spin Qubits due to Interfacial Disorder
2023 · L. Cvitkovich, B. Sklénard, et al. · International Conference on Simulation of Semiconductor Processes and Devices · 1
Microscopic origins of electron trapping in amorphous silicon nitride ( a -Si 3 N 4 ) and its role in charge-trap flash memory
2026 · Christoph Wilhelmer, Lukas Hückmann, et al. · Journal of Physics Condensed Matter
Reliability and Stability Issues in Bi2O2Se/β-Bi2SeO5 Field-Effect Transistors
2026 · Mina Bahrami, Mohammad Rasool Davoudi, et al. · ACS Nano
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Author response for "Microscopic origins of electron trapping in amorphous silicon nitride (a-Si3N4) and its role in charge-trap flash memory"
2026 · Christoph Wilhelmer, Lukas Hückmann, et al.
Towards ultra-scaled nanoelectronics using the zipper material system $Bi_2O_2Se/Bi_2SeO_5$
2025 · Davoudi, Mohammad Rasool, Bahrami, Mina, et al. · arXiv (Cornell University)
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Multi-Scale Simulation Framework for the Modelling of Charge Capture and Emission in Spin Qubit Devices
2025 · G. Boschetto, C. Wilhelmer, et al. · International Conference on Simulation of Semiconductor Processes and Devices
Unveiling Fast Interface Trap Dynamics in Monolayer $\text{MoS}_{2}$ FETs
2025 · Rittik Ghosh, Alexandros Provias, et al. · International Conference on Simulation of Semiconductor Processes and Devices
Modeling the Initial Stages of Si(100) Thermal Oxidation: An Ab-initio Approach
2022 · Cvitkovich, Lukas, Waldhör, Dominic, et al. · arXiv (Cornell University)
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Works count: 30
Citation count: 201
H-index: 8
I10-index: 8
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