Author

K. Vaed

Observed name: Kunal Vaed
Institution: IBM (United States)
OpenAlex ID: A5086074047
2003 · J.-S. Rieh, B. Jagannathan, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 206
2003 · T.S.D. Cheung, J.R. Long, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 101
2004 · J.-S. Rieh, D. Greenberg, et al. · Digest of papers - IEEE Radio Frequency Integrated Circuits Symposium · 59
2004 · T.S.D. Cheung, J.R. Long, et al. · Custom Integrated Circuits Conference · 37
2004 · Y. Tretiakov, K. Vaed, et al. · ARFTG Microwave Measurement Conference · 31
2004 · L. Lanzerotti, N. Feilchenfeld, et al. · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 19
2004 · Y. Tretiakov, K. Vaed, et al. · IEEE International Interconnect Technology Conference (IITC) · 15
2004 · K. Vaed, J. Florkey, et al. · Journal of Microelectromechanical Systems · 13
2005 · K. Vaed, E. Eshun, et al. · IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) · 3
2004 · W. Woods, Y. Tretiakov, et al. · IEEE International Interconnect Technology Conference (IITC) · 2
2004 · Kunal Vaed, William Graham, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
Works count: 11
Citation count: 488
H-index: 8
I10-index: 8
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