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Christian Kapeller

Observed names: C. Kapeller, Kapeller, Christian
ORCID: 0000-0001-6034-8402
Observed ORCID: 0000-0001-6034-8402
OpenAlex ID: A5086562295
Photometric stereo-based high-speed inline battery electrode inspection
2021 · Christian Kapeller, Ernst Bodenstorfer · tm - Technisches Messen · 5
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Trifocal system for high-quality inter-camera mapping and virtual view synthesis
2015 · Florian Seitner, Matej Nezveda, et al. · International Conference on D Imaging · 5
Industry-Fit AI Usage for Crack Detection in Ground Steel
2022 · Daniel Soukup, Christian Kapeller, et al. · Electronics · 4
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Stereo HDR Disparity Map Computation Using Structured Light
2014 · Tara Akhavan, Christian Kapeller, et al. · 4
Perspective‐Aware Fusion of Incomplete Depth Maps and Surface Normals for Accurate 3D Reconstruction
2026 · Ondrej Hlinka, Georg Kaniak, et al. · Electronics Letters · 3
International Conference on Technology and Innovation in Sports, Health and Wellbeing (TISHW)
2017 · Idoia Muñoz, Jokin Garatea, et al. · BMC Sports Science Medicine and Rehabilitation · 3
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Inline battery foil inspection using strobed Photometric Stereo
2020 · Christian Kapeller, Bernhard Blaschitz, et al. · Forum Bildverarbeitung (Image Processing Forum) · 2
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Objective and Subjective Evaluation of a Multi-Stereo 3D Reconstruction System
2020 · Christian Kapeller, Braulio Sespede, et al. · Electronic Imaging · 2
Tailored photometric stereo: Optimization of light source positions for various materials
2020 · Christian Kapeller, Doris Antensteiner, et al. · Electronic Imaging · 2
Depth–Normals Fusion and Photometric Stereo Errors Self-Correction Using Joint Optimization
2026 · Ondrej Hlinka, Doris Antensteiner, et al. · IEEE Signal Processing Letters · 1
Modulares Ringlicht f ¨ ur photometrische Analyse von Mikrostrukturoberfl¨achen
2020 · A. Haider, L. Traxler, et al. · Forum Bildverarbeitung (Image Processing Forum) · 1
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Evaluation of a 3D reconstruction system comprising multiple stereo cameras
2018 · Kapeller, Christian · reposiTUm (TU Wien) · 1
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Texture as Structure: Texture-Induced Surface Normal Artifacts in Inverse Rendering
2026 · Christian Kapeller, Doris Antensteiner · Computer Science Research Notes
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Fast inline photometric stereo using coherent illumination and multi-TDI speckle reduction
2022 · Lukas Traxler, Christian Kapeller, et al. · High-Power Diode Laser Technology
Works count: 15
Citation count: 33
H-index: 4
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