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D. Peters

Observed name: D Peters
Observed institution: University of Duisburg-Essen
OpenAlex ID: A5086958239
Investigation and modeling of impact ionization with regard to the RF and noise behavior of HFET
1997 · R. Reuter, M. Agethen, et al. · IEEE Transactions on Microwave Theory and Techniques · 63
On-wafer microwave measurement setup for investigations on HEMTs and high-T/sub c/ superconductors at cryogenic temperatures down to 20 K
1992 · H. Meschede, R. Reuter, et al. · IEEE Transactions on Microwave Theory and Techniques · 34
Investigation and modeling of impact ionization with regard to the RF- and noise behaviour of HFET
2002 · R. Reuter, M. Agethen, et al. · IEEE MTT-S International Microwave Symposium digest · 16
A new temperature noise model of HFET with special emphasis on a gate-leakage current and investigation of the bias dependence of the equivalent noise sources
1995 · R Reuter, St van Waasen, et al. · European Microwave Conference (EuMC) · 9
RF Investigations on HEMT's at Cryogenic Temperatures Down to 20 K using an On-Wafer Microwave Measurement Setup
1992 · H. Meschede, J. Albers, et al. · European Microwave Conference (EuMC) · 6
Direct calculation of the HBT small-signal equivalent circuit with special emphasize to the feedback capacitance
1995 · D Peters, W Daumann, et al. · European Microwave Conference (EuMC) · 5
On-wafer RF measurement setup for the characterization of HEMTs and high T/sub c/ superconductors at very low temperatures down to 20 K
2003 · H. Meschede, R. Reuter, et al. · IEEE MTT-S International Microwave Symposium digest · 1
Works count: 8
Citation count: 134
H-index: 5
I10-index: 3
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