Author

Yongzhen Luo

Observed institutions: Guangdong University of Technology, Sun Yat-sen University, China Electronic Product Reliability and Environmental Test Institute, Southeast University

ORCID: 0000-0002-6740-6916

Observed ORCID: 0000-0002-6740-6916

OpenAlex ID: A5087023402

Defect-Induced Reliability of TGV Interconnects: A Multiphysics Simulation Study

2025 · Chenbing Qu, Wangjun Zhou, et al. · IEEE Sensors Journal · 2

Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe

2023 · Yongzhen Luo, Xidong Ding, et al. · Micromachines · 2

The detection of buried nanopillar based on electrostatic force microscopy simulation

2022 · Yongzhen Luo, Guocong Lin, et al. · AIP Advances · 2

Imaging the Permittivity of Thin Film Materials by Using Scanning Capacitance Microscopy

2022 · Yongzhen Luo, Xidong Ding, et al. · Applied Sciences · 1

A TSV-based miniaturized multilayer bandpass filter with process-induced defect sensitivity for 3D microsystems

2026 · Chenbing Qu, Yuanxin Yang, et al. · Microelectronics Journal

Uncovering hidden threats: A format-driven approach to dsp instruction set vulnerability discovery

2025 · Yongzhen Luo, Zhongkai Huang, et al. · Computers & Security

A Chip-Level Dual-Core Lockstep Safety Verification Method Based on Electromagnetic Fault Injection

2025 · Zhongkai Huang, Liwei Wang, et al.

Experimental Verification of the Correlation Between Continuous Wave (CW) and Electromagnetic Pulse (EMP) Irradiation Methodologies

2025 · Yongzhen Luo, Shiping Tang, et al. · IEEE Advanced Information Technology, Electronic and Automation Control Conference (IAEAC)

Hacking in DSP: Return-oriented Programming Against CSM

2025 · Yangmao Luo, Yongzhen Luo, et al. · International Conference on Reliability, Maintainability and Safety

Synchronous Electromagnetic Fault Injection Method for ECC Mechanism Safety Verification

2024 · Zhongkai Huang, Yongzhen Luo, et al.

Imaging of electronical and magnetic properties on sub-10 nanometer scale with scanning force microscopy in ambient

2018 · Xidong Ding, Yongzhen Luo, et al. · Integrated ferroelectrics

Works count: 11

Citation count: 7

H-index: 2

I10-index: