Author

James Oerth

OpenAlex ID: A5087249062

Yield Improvement Methodology in a pHEMT GaAs Fabrication Facility

· James Oerth, Christopher Doucette, et al. · 3

RF Test Gage R&R Improvement

2009 · James Oerth, Mike Downs

Improving Organizational Performance through Goal Deployment

2009 · Andy Hunt, James Oerth

Works count: 5

Citation count: 3

H-index: 1

I10-index: