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Taoran Wei

ORCID: 0000-0001-7741-8286
Observed ORCID: 0000-0001-7741-8286
OpenAlex ID: A5102007758
Defective samples simulation through adversarial training for automatic surface inspection
2019 · Lizhe Liu, Danhua Cao, et al. · Neurocomputing · 40
A lowlight image enhancement method learning from both paired and unpaired data by adversarial training
2020 · Qun Yang, Yubin Wu, et al. · Neurocomputing · 34
A simulation-based few samples learning method for surface defect segmentation
2020 · Taoran Wei, Danhua Cao, et al. · Neurocomputing · 21
Defective samples simulation through neural style transfer for automatic surface defect segment
2020 · Taoran Wei, Danhua Cao, et al. · International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems (OIT) · 11
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A fast button surface defects detection method based on convolutional neural network
2018 · Lizhe Liu, Danhua Cao, et al. · International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems (OIT) · 5
Time Series in Functional Data Analysis
2015 · Taoran Wei · 2
Works count: 6
Citation count: 113
H-index: 5
I10-index: 4
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