Author

Hak S. Kim

Observed names: Hak Kim, Hak S Kim, Kim, Hak S.

Institution: Science Systems and Applications (United States)

Observed institutions: Goddard Space Flight Center, Seoul National University, Hanbat National University, Ollscoil na Gaillimhe – University of Galway, National Aeronautics and Space Administration, Jackson and Tull (United States), Science Systems and Applications (United States), MEI Technologies (United States), Samsung Electronics (South Korea), Sun Moon University, Pukyong National University

ORCID: 0000-0002-4781-5210

Observed ORCID: 0000-0002-4781-5210

OpenAlex ID: A5103051661

Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

2009 · Brian D. Sierawski, Jonathan A. Pellish, et al. · IEEE Transactions on Nuclear Science · 198

Space Radiation Effects on SiC Power Device Reliability

2021 · Jean-Marie Lauenstein, Megan C. Casey, et al. · IEEE International Reliability Physics Symposium proceedings · 109

32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches

2011 · Kenneth P. Rodbell, David F. Heidel, et al. · IEEE Transactions on Nuclear Science · 62

Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs

2008 · Alan D. Tipton, Jonathan A. Pellish, et al. · IEEE Transactions on Nuclear Science · 59

Single-Event Effect Performance of a Commercial Embedded ReRAM

2014 · Dakai Chen, Hak Kim, et al. · IEEE Transactions on Nuclear Science · 47

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

2017 · Dakai Chen, Edward Wilcox, et al. · IEEE Transactions on Nuclear Science · 44

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Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

2014 · Jonathan A. Pellish, Paul W. Marshall, et al. · IEEE Transactions on Nuclear Science · 38

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An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays

2006 · Melanie Berg, Jih-Jong Wang, et al. · IEEE Transactions on Nuclear Science · 36

The effects of operating bias conditions on the proton tolerance of SiGe HBTs

2003 · Shiming Zhang, John D. Cressler, et al. · Solid-State Electronics · 34

Single-Event Effects in Silicon Carbide Power Devices

2015 · Jean‐Marie Lauenstein, Megan C. Casey, et al. · 29

Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA

2012 · Martha V. O'Bryan, Kenneth A. LaBel, et al. · IEEE Radiation Effects Data Workshop (REDW) · 26

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Effects of Ion Atomic Number on Single-Event Gate Rupture (SEGR) Susceptibility of Power MOSFETs

2011 · Jean-Marie Lauenstein, Neil Goldsman, et al. · IEEE Transactions on Nuclear Science · 26

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Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory

2016 · Dakai Chen, Edward Wilcox, et al. · IEEE Transactions on Nuclear Science · 24

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TPA Laser and Heavy-Ion SEE Testing: Complementary Techniques for SDRAM Single-Event Evaluation

2009 · Ray L. Ladbury, Joe Benedetto, et al. · IEEE Transactions on Nuclear Science · 23

Design of dual‐band antenna for the ISM band using a backed microstrip line

2004 · Seok H. Choi, Jong K. Park, et al. · Microwave and Optical Technology Letters · 21

Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM

2015 · Dakai Chen, Edward Wilcox, et al. · IEEE Transactions on Nuclear Science · 19

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Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

2010 · Martha V. O'Bryan, Kenneth A. LaBel, et al. · IEEE Radiation Effects Data Workshop (REDW) · 18

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Compendium of Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASA

2006 · Donna J. Cochran, Tim L. Kniffin, et al. · IEEE Radiation Effects Data Workshop (REDW) · 18

Single-Event Effects in Silicon and Silicon Carbide Power Devices

2014 · Jean‐Marie Lauenstein, Megan C. Casey, et al. · NASA Technical Reports Server (NASA) · 17

Recent Radiation Test Results for Power MOSFETs

2013 · Jean-Marie Lauenstein, Alyson D. Topper, et al. · IEEE Radiation Effects Data Workshop (REDW) · 17

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

2011 · Martha V. O'Bryan, Kenneth A. LaBel, et al. · IEEE Radiation Effects Data Workshop (REDW) · 17

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The Effects of Elevated Temperature on Pulsed-Laser-Induced Single Event Transients in Analog Devices

2009 · Dakai Chen, Stephen P. Buchner, et al. · IEEE Transactions on Nuclear Science · 16

A Comprehensive Methodology for Complex Field Programmable Gate Array Single Event Effects Test and Evaluation

2009 · Melanie D. Berg, Kenneth A. LaBel, et al. · IEEE Transactions on Nuclear Science · 15

Interpreting Space-Mission LET Requirements for SEGR in Power MOSFETs

2010 · Jean-Marie Lauenstein, Raymond L. Ladbury, et al. · IEEE Transactions on Nuclear Science · 14

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Recent Radiation Test Results for Trench Power MOSFETs

2017 · Jean-Marie Lauenstein, Megan C. Casey, et al. · IEEE Radiation Effects Data Workshop (REDW) · 13

Works count: 98

Citation count: 1,180

H-index: 18

I10-index: 35