Author

Robert K. Hickernell

Observed names: R K Hickernell, R. K. Hickernell, R.K Hickernell, R.K. Hickernell, Robert K Hickernell

Institution: National Institute of Standards and Technology

Observed institutions: National Institute of Standards and Technology, United States Department of Commerce, University of Arizona, University of Colorado Boulder

OpenAlex ID: A5108635517

Optical field enhancement by long-range surface-plasma waves

1982 · Dror Sarid, Robert T. Deck, et al. · Applied Optics · 66

Waveguide loss measurement using photothermal deflection

1988 · Robert K. Hickernell, Donald R. Larson, et al. · Applied Optics · 37

Optical bistability using prism-coupled, long-range surface plasmons

1986 · Robert K. Hickernell, Dror Sarid · Journal of the Optical Society of America B · 36

Y-branch waveguide glass laser and amplifier

1991 · N. A. Sanford, K. J. Malone, et al. · Optics Letters · 31

Long-range surface magnetoplasmons in thin nickel films

1987 · Robert K. Hickernell, Dror Sarid · Optics Letters · 28

Pump-induced dispersion of erbium-doped fiber measured by Fourier-transform spectroscopy

1993 · Robert K. Hickernell, Kazumasa Takada, et al. · Optics Letters · 25

Direct dispersion measurement of highly -erbium -doped optical amplifiers using a low coherence reflectometer coupled with dispersive Fourier spectroscopy

1992 · K. Takada, T. Kitagawa, et al. · Electronics Letters · 23

Characterization of vertical-cavity semiconductor structures

1992 · D. H. Christensen, J. G. Pellegrino, et al. · Journal of Applied Physics · 17

Optical bistability on reflection with an InSb étalon controlled by a guided wave

1984 · Dror Sarid, Ralph S. Jameson, et al. · Optics Letters · 17

Accuracy of AlGaAs growth rates and composition determination using RHEED oscillations

2003 · T.E Harvey, K.A Bertness, et al. · Journal of Crystal Growth · 15

Determination of the complex refractive index of individual quantum wells from distributed reflectance

1994 · Robert K. Hickernell, David H. Christensen, et al. · Journal of Applied Physics · 11

Waveguide polarizers with hydrogenated amorphous silicon claddings

1991 · David L. Veasey, Theodore E. Batchman, et al. · Optics Letters · 11

Evaluating epitaxial growth stability

1997 · D.H. Christensen, J.R. Hill, et al. · Materials Science and Engineering B · 9

Compact solid-state waveguide lasers

2003 · B.E. Callicoatt, J.B. Schlager, et al. · IEEE Circuits and Devices Magazine · 7

Noise reduction in opticalin situmeasurements for molecular beam epitaxy by substrate wobble normalization

1998 · K. A. Bertness, R. K. Hickernell, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 6

Vertical-cavity semiconductor lasers: structural characterization, CAD, and DFB structures

1993 · David H. Christensen, Craig A. Parsons, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6

Optical Waveguide Attenuation Measured by Photothermal Displacement

1989 · Robert K. Hickernell, J. A. Aust, et al. · 6

Passive and active characterization of hybrid glass substrates for telecommunication applications

2002 · Joseph S. Hayden, Robert D. Simpson, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5

Chromatic Dispersion Measurement of Erbium-Doped Fiber Amplifier Using Fourier Transform Spectroscopy

1992 · Robert K. Hickernell, K. Takada, et al. · NIST Interagency/Internal Report (NISTIR) - · 5

Optical fiber sensors: Accelerating applications in Navy ships

1994 · G. W. Day, Peter S. Lovely, et al. · 4

Issues affecting the characterization of integrated optical devices subjected to ionizing radiation

1991 · Robert K. Hickernell, Norman A. Sanford, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4

Single-frequency and mode-locked Er/Yb co-doped waveguide lasers

2002 · B.E. Callicoatt, J.B. Schlager, et al. · IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS) · 3

Wobble Normalization for Optical In Situ Measurements in Molecular Beam Epitaxy

1997 · Kristine A. Bertness, Robert K. Hickernell, et al. · 3

Comparative Photoluminescence Measurement and Simulation of Vertical-Cavity Semiconductor Laser Structures

1993 · D.T. Schaafsma, D.H. Christensen, et al. · MRS Proceedings · 3

Vertical-Cavity Optoelectronic Structures: CAD, Growth, and Structural Characterization

1992 · D. H. Christensen, S. M. Crochiere, et al. · MRS Proceedings · 3

Works count: 44

Citation count: 393

H-index: 11

I10-index: 12