Author

Hiroomi Nakajima

Observed name: 博臣 中島
OpenAlex ID: A5109347142
2006 · Tomoaki Shino, Naoki Kusunoki, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 33
2007 · Takeshi Hamamoto, Yoshihiro Minami, et al. · IEEE Transactions on Electron Devices · 27
2007 · Fumiyoshi Matsuoka, Takashi Ohsawa, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 12
2008 · Takashi Ohsawa, Ryo Fukuda, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 8
2009 · Takashi Ohsawa, Ryo Fukuda, et al. · IEEE Transactions on Electron Devices · 5
2010 · Takeshi Hamamoto, Yoshiaki Fukuzumi, et al. · IEEE Transactions on Electron Devices · 1
2024 · Hiroomi Nakajima, Tomoaki Shino, et al. · Japanese Journal of Applied Physics
2024 · Hiroomi Nakajima, Tomoaki Shino, et al. · Japanese Journal of Applied Physics
2007 · 博臣 中島, 直樹 楠, et al. · IEICE Technical Report; IEICE Tech. Rep.
2007 · Hiroomi Nakajima, N. Kusunoki, et al. · IEICE technical report. Speech
2007 · Hiroomi Nakajima, N. Kusunoki, et al. · IEICE Technical Report; IEICE Tech. Rep.
2006 · 博臣 中島, 良博 南, et al. · 電子情報通信学会技術研究報告. ICD, 集積回路
2006 · 博臣 中島, 良博 南, et al. · IEICE Technical Report; IEICE Tech. Rep.
2006 · Hiroomi Nakajima, Y. Minami, et al. · IEICE Technical Report; IEICE Tech. Rep.
2006 · 良博 南, 智彰 篠, et al. · SIAM International Conference on Data Mining
2006 · 良博 南, 智彰 篠, et al. · SIAM International Conference on Data Mining
2005 · 隆 大澤, 勝之 藤田, et al. · 電子情報通信学会技術研究報告. ICD, 集積回路
2005 · Takashi Ohsawa, K. Fujita, et al. · 電子情報通信学会技術研究報告. ICD, 集積回路
2005 · 隆 大澤, 勝之 藤田, et al. · 電子情報通信学会技術研究報告. ICD, 集積回路
2003 · 隆 大澤, 知輝 東, et al. · 電子情報通信学会技術研究報告. ICD, 集積回路
2003 · 良博 南, 和美 井納, et al. · SIAM International Conference on Data Mining
Works count: 26
Citation count: 86
H-index: 5
I10-index: 3
Year
Topic
Type