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T. Nakamichi

Observed names: Nakamichi, T., T Nakamichi
Institution: JEOL (Japan)
Observed institution: JEOL (Japan)
OpenAlex ID: A5110017745
Measurement method of aberration from Ronchigram by autocorrelation function
2008 · H. Sawada, T. Sannomiya, et al. · Ultramicroscopy · 87
Correction of higher order geometrical aberration by triple 3-fold astigmatism field
2009 · H. Sawada, T. Sasaki, et al. · Journal of Electron Microscopy · 77
Higher-order aberration corrector for an image-forming system in a transmission electron microscope
2010 · H. Sawada, T. Sasaki, et al. · Ultramicroscopy · 46
Performance and Application of Chromatic/Spherical Aberration-Corrected 30 kV Transmission Electron Microscope
2011 · T Sasaki, H Sawada, et al. · Microscopy and Microanalysis · 4
Practical Remote Electron Microscopy - A Vendor's Perspective
2011 · T Isabell, N Erdman, et al. · Microscopy and Microanalysis · 1
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Determination of Aberration Center of STEM Ronchigram for Fully Automated Aberration Correctors
2013 · T. Sannomiya, H. Sawada, et al. · Microscopy and Microanalysis
Determination of Aberration Center of Ronchigram for Automated Aberration-Corrected Scanning Transmission Electron Microscopy
2013 · 三宮, 工, Sawada, H., et al. · Institutional Repositories DataBase (IRDB)
Performance of Low-voltage Electron Microscope with New Aberration Correction System and Cold Field Emission Gun
2009 · T Sasaki, H Sawada, et al. · Microscopy and Microanalysis
Measurement method of aberration from Ronchigram by autocorrelation function
2008 · 沢田 英敬, H. Sawada, et al. · Institutional Repositories DataBase (IRDB)
Works count: 10
Citation count: 215
H-index: 4
I10-index: 3
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