Author

Jonathan Abrokwah

2002 · M. Passlack, J.K. Abrokwah, et al. · IEEE Electron Device Letters · 88
2005 · M. Passlack, R. Droopad, et al. · IEEE Electron Device Letters · 79
2003 · Z. Yu, C. D. Overgaard, et al. · Applied Physics Letters · 73
2006 · Karthik Rajagopalan, Jonathan Abrokwah, et al. · IEEE Electron Device Letters · 68
2007 · M. Passlack, A. Zlotnicka, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 60
1983 · B. J. Skromme, T. S. Low, et al. · Journal of Electronic Materials · 60
1983 · R. M. Kolbas, J. Abrokwah, et al. · Applied Physics Letters · 56
2007 · K. Rajagopalan, R. Droopad, et al. · IEEE Electron Device Letters · 52
2007 · Lianjun Liu, Shun-Meen Kuo, et al. · IEEE Transactions on Components and Packaging Technologies · 46
2006 · M. Passlack, K. Rajagopalan, et al. · IEEE Transactions on Electron Devices · 40
2002 · J.K. Abrokwah, J.H. Huang, et al. · 39
1986 · N.C. Cirillo, M.S. Shur, et al. · IEEE Electron Device Letters · 39
2005 · R. Droopad, M. Passlack, et al. · Microelectronic Engineering · 31
1986 · M.S. Shur, D.K. Arch, et al. · IEEE Electron Device Letters · 31
1999 · X. Yao, Xiaoming Hu, et al. · Physical review. B, Condensed matter · 28
1987 · J. Baek, M.S. Shur, et al. · IEEE Transactions on Electron Devices · 28
1985 · N.C. Cirillo, M.S. Shur, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 28
1981 · J. K. Abrokwah, M. Gershenzon · Journal of Electronic Materials · 26
1999 · M. Passlack, Z. Yu, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 23
1986 · Jun Ho Baek, M. Shur, et al. · IEEE Electron Device Letters · 23
2002 · A.P. De Silva, C. Vaughan, et al. · 22
2002 · B. Bernhardt, M. LaMacchia, et al. · IEEE Gallium Arsenide Integrated Circuit Symposium (GaAs IC) · 20
2003 · M. Passlack, J. K. Abrokwah, et al. · Applied Physics Letters · 19
Works count: 97
Citation count: 1,611
H-index: 22
I10-index: 45
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