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Derren N. Dunn

A 7nm FinFET technology featuring EUV patterning and dual strained high mobility channels
2016 · R. Xie, P. Montanini, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 145
Visible light emission from Si nanocrystals grown by ion implantation and subsequent annealing
1997 · S. Guha, M. D. Pace, et al. · Applied Physics Letters · 129
Wear behavior of Pb–Mo–S solid lubricating coatings
1999 · K.J Wahl, D.N Dunn, et al. · Wear · 125
Reconstruction of three-dimensional chemistry and geometry using focused ion beam microscopy
1999 · D. N. Dunn, R. Hull · Applied Physics Letters · 86
Focused ion-beam tomography
2004 · A. J. Kubis, G. J. Shiflet, et al. · Metallurgical and Materials Transactions A · 80
Effects of ion implantation on microstructure, endurance and wear behavior of IBAD MoS2
2000 · K.J Wahl, D.N Dunn, et al. · Wear · 52
Investigation of CVD SiCOH low-k time-dependent dielectric breakdown at 65nm node technology
2005 · F. Chen, K. Chanda, et al. · IEEE International Reliability Physics Symposium proceedings · 42
EUV patterning successes and frontiers
2016 · Nelson Felix, Dan Corliss, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 27
The origin of an anomalous, low 2θ peak in x-ray diffraction spectra of MoS2 films grown by ion beam assisted deposition
1997 · D. N. Dunn, L. E. Seitzman, et al. · Journal of materials research/Pratt's guide to venture capital sources · 27
The Effect of Membrane Charge on Gold Nanoparticle Synthesis via Surfactant Membranes
1999 · Michael A. Markowitz, Derren N. Dunn, et al. · Journal of Colloid and Interface Science · 26
UHV microscopy of surfaces
1991 · L.D. Marks, R. Ai, et al. · Ultramicroscopy · 24
Comprehensive reliability evaluation of a 90 nm CMOS technology with Cu/PECVD low-k BEOL
2004 · D. Edelstein, H. Rathore, et al. · IEEE International Reliability Physics Symposium proceedings · 23
Phospholipid Mediated Synthesis and Characterization of Gold Nanoparticles
1996 · G.M. Chow, M.A. Markowitz, et al. · Journal of Colloid and Interface Science · 23
Quantitative three-dimensional reconstruction of geometrically complex structures with nanoscale resolution
2002 · D. N. Dunn, G. J. Shiflet, et al. · Review of Scientific Instruments · 19
Atomic imaging of surfaces in plan view
1993 · P. Xu, D. Dunn, et al. · Surface Science · 19
Reliability, yield, and performance of a 90 nm SOI/Cu/SiCOH technology
2004 · D. Edelstein, C. Davis, et al. · IEEE International Interconnect Technology Conference (IITC) · 18
MoS2 deposited by ion beam assisted deposition: 2H or random layer structure?
1998 · D. N. Dunn, L. E. Seitzman, et al. · Journal of materials research/Pratt's guide to venture capital sources · 18
Evolution of nanoscale texture in ultrathin TiN films
2001 · M. J. Williamson, D. N. Dunn, et al. · Applied Physics Letters · 17
UHV transmission electron microscopy of Ir(001)
1993 · L.D. Marks, P. Xu, et al. · Surface Science · 16
UHV microscopy of the reconstructed Au(001) surface
1992 · D.N. Dunn, J.P. Zhang, et al. · Surface Science · 16
32 nm logic patterning options with immersion lithography
2008 · K. Lai, S. Burns, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 12
UHV transmission electron microscopy of Ir(001)
1993 · D.N. Dunn, P. Xu, et al. · Surface Science · 12
Design intent optimization at the beyond 7nm node: the intersection of DTCO and EUVL stochastic mitigation techniques
2017 · Michael Crouse, Lars Liebmann, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 11
Dark field double dipole lithography (DDL) for back-end-of-line processes
2007 · M. Burkhardt, Sean Burns, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
Analysis of the three-dimensional ordering of epitaxial Ge quantum dots using focused ion beam tomography
2006 · Alan J. Kubis, Thomas E. Vandervelde, et al. · Applied Physics Letters · 9
Works count: 87
Citation count: 1,141
H-index: 17
I10-index: 23
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