Author

L.-F. Zou

Observed names: L.-F Zou, Zou L F, Zou Lf

Institution: Centro de Investigaciones en Optica

Observed institutions: Centro de Investigaciones en Optica, Arizona State University

OpenAlex ID: A5110692603

Mueller matrix for characterization of one-dimensional rough perfectly reflecting surfaces in a conical configuration

1998 · R. E. Luna, S. E. Acosta-Ortiz, et al. · Optics Letters · 15

Damage removal and defect control in As ion implanted Si1−xGex epilayers during a high-temperature annealing process

2000 · L.-F Zou, S.E Acosta-Ortiz, et al. · Microelectronic Engineering · 1

Damage removal and boron diffusion during solid phase epitaxial growth of SiGe alloy layers

1999 · L.-F. Zou, S.E. Acosta-Ortiz, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1

Properties of Epitaxial Sr_2RuO 4 and Ba_2RuO 4 Films Grown at Various Oxygen Partial Pressures by Pulsed Laser Deposition

1998 · L.-F. Zou, S. J. Briczinski, et al. · APS

Boron diffusion in Ge+ premorphized and BF2+ implanted Si(001)

1998 · Zou Lf, Acosta-Ortiz Se, et al. · SEMI-IR

Gas source molecular beam epitaxy and thermal stability of Si1-xGex/Si superlattice materials

1998 · Zou Lf, Acosta-Ortiz Se, et al. · SEMI-IR

Passivation of Ag on SiO 2 by Annealing Ag-Ti Alloys in an Ammonia Ambient

1996 · Daniel Adams, T. L. Alford, et al. · European Solid-State Device Research Conference

Works count: 8

Citation count: 17

H-index: 1

I10-index: 1