Get started
Author

David Huy Trinh

Observed name: David H. Trinh
Observed institution: Linköping University
OpenAlex ID: A5111404401
Influence of the normalized ion flux on the constitution of alumina films deposited by plasma-assisted chemical vapor deposition
2007 · Denis Kurapov, Jennifer Reiss, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 15
Nanocrystalline Alumina-Zirconia Thin Films Grown by Magnetron Sputtering
2008 · David Huy Trinh · DiVA (Linkoping University) · 2
Tapered Roller Bearing Accelerated Fatigue Life Test Rig Design
2015 · Hilton Bennett, Elizabeth Englert, et al. · VCU Scholars Compass (Virginia Commonwealth University) · 1
PDF
Structural and mechanical characterisation of nanocomposite Al2O3-ZrO2 thin films grown by reactive dual radio-frequency magnetron sputtering”
2006 · David Huy Trinh, Mikael Ottosson, et al. · 1
Synthesis and Characterisation of Magnetron Sputtered Alumina-Zirconia Thin Films
2006 · David Huy Trinh · 1
Mass-spectrometry of the positive-ion flux during radio-frequency sputter deposition of alumina-zirconia nanocomposites
2009 · David Huy Trinh, Lars Hultman, et al.
Works count: 6
Citation count: 20
H-index: 2
I10-index: 1
Year
Topic
Type