Author

Sa. K. Narayandass

Observed names: S K Narayandass, S. K. Narayandass, S.K. Narayandass, SA. K. NARAYANDASS, SA. K. Narayandass, SA.K Narayandass, SA.K. Narayandass, Sa K Narayandass, Sa.K Narayandass, Sa.K. Narayandass

Observed institution: Bharathiar University

OpenAlex ID: A5111458730

Properties of titanium nitride films prepared by direct current magnetron sputtering

2006 · Y.L. Jeyachandran, Sa.K. Narayandass, et al. · Materials Science and Engineering A · 177

Structural and optical properties of CdS thin films

2001 · K. Senthil, D. Mangalaraj, et al. · Applied Surface Science · 130

Dielectric properties of Cd0.6Zn0.4Te thin films

2003 · K. Prabakar, Sa. K. Narayandass, et al. · physica status solidi (a) · 127

Characterization of transparent conducting CdO films deposited by spray pyrolysis

1994 · K Gurumurugan, D Mangalaraj, et al. · Semiconductor Science and Technology · 114

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Structure, optical and electrical properties of ZnSe thin films

2005 · S. Venkatachalam, D. Mangalaraj, et al. · Physica B Condensed Matter · 103

Properties of titanium thin films deposited by dc magnetron sputtering

2006 · Y.L. Jeyachandran, B. Karunagaran, et al. · Materials Science and Engineering A · 98

Bacterial adhesion studies on titanium, titanium nitride and modified hydroxyapatite thin films

2006 · Y.L. Jeyachandran, S. Venkatachalam, et al. · Materials Science and Engineering C · 98

Dielectric and conduction properties of pure polyimide films

2001 · S Muruganand, Sa K Narayandass, et al. · Polymer International · 84

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Pulsed laser deposited vanadium oxide thin films for uncooled infrared detectors

2003 · R.T. Rajendra Kumar, B. Karunagaran, et al. · Sensors and Actuators A Physical · 83

Influence of thermal annealing on the composition and structural parameters of DC magnetron sputtered titanium dioxide thin films

2002 · B. Karunagaran, R.T. Rajendra Kumar, et al. · Crystal Research and Technology · 78

Characterization of vacuum-evaporated ZnSe thin films

2006 · S. Venkatachalam, Y.L. Jeyachandran, et al. · Materials Characterization · 71

Structural characterization of cadmium oxide thin films deposited by spray pyrolysis

1995 · K. Gurumurugan, D. Mangalaraj, et al. · Journal of Crystal Growth · 70

Growth, structure, dielectric and AC conduction properties of solution grown PVA films

1999 · B Chandar Shekar, V Veeravazhuthi, et al. · Thin Solid Films · 68

Characterization of vacuum-evaporated ZnSe thin films

2006 · S. Venkatachalam, D. Mangalaraj, et al. · Physica B Condensed Matter · 63

Argon and nitrogen implantation effects on the structural and optical properties of vacuum evaporated cadmium sulphide thin films

2002 · K Senthil, D Mangalaraj, et al. · Semiconductor Science and Technology · 61

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Structural properties of V2O5 thin films prepared by vacuum evaporation

2003 · R.T. Rajendra Kumar, B. Karunagaran, et al. · Materials Science in Semiconductor Processing · 60

Dielectric and electric modulus properties of vacuum evaporated Cd0.8Zn0.2Te thin films

2003 · K. Prabakar, Sa.K. Narayandass, et al. · Materials Science and Engineering B · 60

Room temperature deposited vanadium oxide thin films for uncooled infrared detectors

2003 · R.T.Rajendra Kumar, B. Karunagaran, et al. · Materials Research Bulletin · 58

Structural characterization of hot wall deposited cadmium selenide thin films

1998 · S Velumani, Sa K Narayandass, et al. · Semiconductor Science and Technology · 58

The effect of annealing on vacuum-evaporated copper selenide and indium telluride thin films

2007 · P. Peranantham, Y.L. Jeyachandran, et al. · Materials Characterization · 57

Structural, optical, and electrical properties of cadmium oxide films deposited by spray pyrolysis

1994 · K. Gurumurugan, D. Mangalaraj, et al. · physica status solidi (a) · 55

Study of a pulsed laser deposited vanadium oxide based microbolometer array

2003 · R T Rajendra kumar, B Karunagaran, et al. · Smart Materials and Structures · 54

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Microstructure, Raman and optical studies on Cd0.6Zn0.4Te thin films

2004 · K Prabakar, S Venkatachalam, et al. · Materials Science and Engineering B · 53

Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies

2003 · B. Karunagaran, R.T. Rajendra Kumar, et al. · Materials Science in Semiconductor Processing · 53

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 · B. Karunagaran, R. T. Rajendra Kumar, et al. · Crystal Research and Technology · 53

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Works count: 128

Citation count: 3,518

H-index: 36

I10-index: 84