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Y-T. Wu
Observed names:
Y-T. (Justin) Wu,
Y-t. (justin Wu
Institution:
Intel (United States)
Observed institutions:
Intel (United States),
National Yang Ming Chiao Tung University,
National Taiwan University,
Applied Research Associates (United States)
OpenAlex ID:
A5111467995
Variable screening and ranking using sampling-based sensitivity measures
2005
·
Y-T. Wu
, Sitakanta Mohanty
·
Reliability Engineering & System Safety
·
111
A Framework for Reliability-Based MDO of Aerospace Systems
2002
·
Mohammad Aminpour
, Youngwon Shin
, et al.
·
AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference (SDM)
·
13
Improvement of oxide reliability in NAND flash memories using tight endurance cycling with shorter idling period
2015
·
R. Shirota
, B-J. Yang
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
7
Intel 18A-P CMOS Technology Enhancement Featuring Advanced RibbonFET (GAA) Transistors and PowerVia for High-Performance Computing
2026
·
A. Bowonder
, O. Acton
, et al.
·
IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
319P Survival prediction for ovarian cancer patients from Taiwan cancer registry data
2023
·
T-P. Lu
, A. Chattopadhyay
, et al.
·
Annals of Oncology
PDF
Improvement of Oxide Reliability in NAND Flash Memories Using Tight Endurance Cycling with Shorter Idling Period
2015
·
Shirota R
, B-J. Yang
, et al.
·
Institutional Repositories DataBase (IRDB)
MCMC-Based Simulation Method for Efficient Risk- Based Maintenance Optimization
2009
·
Y-T. (Justin) Wu
·
SAE technical papers on CD-ROM/SAE technical paper series
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Works count:
9
Citation count:
131
H-index:
3
I10-index:
2
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