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E. Langenbach

Observed name: Eckard Langenbach
Observed institution: FISBA OPTIK (Switzerland)
OpenAlex ID: A5111483642
A Fabry–Perot interferometer for micrometer-sized cantilevers
2005 · B. W. Hoogenboom, P. L. T. M. Frederix, et al. · Applied Physics Letters · 95
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Micro-optic solutions for beam shaping of individually addressable high-power single-mode diode laser arrays
2010 · M. Forrer, D. Kura, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
Diffractive optics for compact space communication terminals
1996 · P. Blattner, H. P. Herzig, et al. · Journal of Modern Optics · 7
Fast axis collimation for high power diode lasers
2009 · D. Kura, H. Moser, et al. · IEEE High Power Diode Lasers and Systems Conference (HPD) · 5
Increasing critcal depth of cut in ductile mode machining of tungsten carbide by process parameter controlling
2018 · Oliver Faehnle, Marius Doetz, et al. · European Seminar on Precision Optics Manufacturing · 1
Fabrication and qualification of roughness reference samples for industrial testing of surface roughness levels below 0.5 nm Sq
2015 · O. Faehnle, E. Langenbach, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Works count: 6
Citation count: 116
H-index: 4
I10-index: 1
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