Author

Ian P. Hayward

Observed names: I P Hayward, I. Hayward, I. P. Hayward, I.P. Hayward, IP Hayward, Ian Hayward
OpenAlex ID: A5111488668
1992 · I.P. Hayward, I.L. Singer, et al. · Wear · 178
1998 · Y.F. Jia, C.J. Steele, et al. · Carbon · 97
1991 · I.P. Hayward · Surface and Coatings Technology · 96
1994 · K. P. J. Williams, G. D. Pitt, et al. · Journal of Raman Spectroscopy · 94
1995 · IP Hayward, TE Kirkbride, et al. · Journal of Forensic Sciences · 49
2003 · C. A. Froud, I. P. Hayward, et al. · Applied Spectroscopy · 47
2008 · L. Cui, S. Mahajan, et al. · Physical Chemistry Chemical Physics · 46
2005 · G.D. Pitt, D.N. Batchelder, et al. · IEE Proceedings - Science Measurement and Technology · 38
1995 · Ian P. Hayward, Kurt J. Baldwin, et al. · Diamond and Related Materials · 38
2002 · H. S. Sands, F. Demangeot, et al. · Journal of Raman Spectroscopy · 27
2001 · G K Banini, M M Chaudhri, et al. · Journal of Physics D Applied Physics · 26
1996 · W. N. Wang, N. A. Fox, et al. · physica status solidi (a) · 18
1995 · P. Alers, H.E. Hintermann, et al. · Thin Solid Films · 8
1997 · Richard J. Lacey, Ian P. Hayward, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
1988 · I P Hayward, J E Field · Journal of Physics E Scientific Instruments · 7
1990 · Linda S. Plano, Ian Hayward, et al. · Defense Technical Information Center (DTIC) · 1
1995 · Yunping Yang, I. P. Hayward · The Journal of Light Scattering
1990 · Linda S. Plano, I. P. Hayward, et al. · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
Works count: 18
Citation count: 777
H-index: 12
I10-index: 12
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