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Mike Bruce
Observed names:
Bruce, M. R.,
M R Bruce,
M. Bruce,
M. R. Bruce,
M.R. Bruce,
MR Bruce
show all 6
Observed institutions:
Argonne National Laboratory,
Sandia National Laboratories,
Indiana University Bloomington,
Advanced Micro Devices (United States),
Indiana University,
The University of Texas at Austin
show all 6
OpenAlex ID:
A5111548424
Absolute partial and total electron-impact-ionization cross sections for CF4 from threshold up to 500 eV
1991
·
Ce Ma
, M. R. Bruce
, et al.
·
Physical Review A
·
103
Radiative lifetimes and collisional deactivation of two-photon excited xenon in argon and xenon
1990
·
M. R. Bruce
, W. B. Layne
, et al.
·
The Journal of Chemical Physics
·
72
On the partial ionization cross-sections for CF4 by use of the pulsed-electron-beam time-of-flight method
1993
·
M.R. Bruce
, R.A. Bonham
·
International Journal of Mass Spectrometry and Ion Processes
·
66
Positive ion pair production by electron impact dissociative ionization of CF4
1992
·
M.R. Bruce
, Ce Ma
, et al.
·
Chemical Physics Letters
·
66
Covariance mapping mass spectroscopy using a pulsed electron ionizing source: application to CF4
1994
·
M R Bruce
, L Mi
, et al.
·
Journal of Physics B Atomic Molecular and Optical Physics
·
64
PDF
Collisional deactivation of two-photon laser excited xenon 5p5 6p. II. Lifetimes and total quench rates
1986
·
N. Böwering
, M. R. Bruce
, et al.
·
The Journal of Chemical Physics
·
64
Deactivation of two-photon excited Xe(5p56p,6p′,7p) and Kr(4p55p) in xenon and krypton
1995
·
C. A. Whitehead
, H. Pournasr
, et al.
·
The Journal of Chemical Physics
·
59
Collisional deactivation of two-photon laser excited xenon 5p5 6p. I. State-to-state reaction rates
1986
·
N. Böwering
, M. R. Bruce
, et al.
·
The Journal of Chemical Physics
·
58
A review of laser induced techniques for microelectronic failure analysis
2004
·
J.C.H. Phang
, D.S.H. Chan
, et al.
·
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
·
53
Problems in the measurement of the Ar2+/Ar+ partial ionization cross-section ratio by use of the pulsed-electron-beam time-of-flight method
1992
·
M. R. Bruce
, R. A. Bonham
·
Zeitschrift für Physik D Atoms Molecules and Clusters
·
43
Resistive interconnection localization
2003
·
E.I. Cole
, P. Tangyunyong
, et al.
·
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
·
26
Soft defect localization (SDL) in integrated circuits using laser scanning microscopy
2004
·
M.R. Bruce
, V.J. Bruce
, et al.
·
IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS)
·
22
Reactive quenching of two-photon excited xenon atoms by Cl2
1990
·
M. R. Bruce
, W. B. Layne
, et al.
·
The Journal of Chemical Physics
·
22
PDF
Erratum: Absolute partial and total electron-impact-ionization cross sections for CF4 from threshold up to 500 eV [Phys. Rev. A44, 2921 (1991)]
1992
·
Ce Ma
, M. R. Bruce
, et al.
·
Physical Review A
·
20
PDF
Waveform Acquisition from the Backside of Silicon Using Electro-Optic Probing
1999
·
Mike Bruce
, Greg Dabney
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
15
Electron-ion coincidence experiments: absolute detector efficiencies and neutral dissociation cross sections
1995
·
M.R. Bruce
, R.A. Bonham
·
Journal of Molecular Structure
·
13
A multichannel harpoon model for reactive quenching of Xe 5p5n p by Cl2
1990
·
M. R. Bruce
, W. B. Layne
, et al.
·
The Journal of Chemical Physics
·
12
New Signal Detection Methods for Thermal Beam Induced Phenomenon
2001
·
Murugesan Palaniappan
, J.M. Chin
, et al.
·
National University of Singapore
·
7
Dissociative Ionisation and Neutral Dissociation: CF4, a Case Study
1992
·
RA Bonham
, MR Bruce
·
Australian Journal of Physics
·
7
PDF
Controlled silicon thinning for design debug of C4 packaged ICs
2003
·
R.R. Goruganthu
, M. Bruce
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
6
Through silicon in-circuit logic analysis for localizing logic pattern failures
2012
·
M.R. Bruce
, L.K. Ross
, et al.
·
Microelectronics Reliability
·
4
Optical tools and techniques for failure analysis of modern integrated circuits
2004
·
E.I. Cole
, M.R. Bruce
, et al.
·
IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS)
·
3
Single Point PICA Probing with an Avalanche Photo-Diode
2001
·
Mike Bruce
, Rama R. Goruganthu
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
2
Harpooning reactions of excited rare gas atoms
1992
·
J.W. Keto
, W.B. Layne
, et al.
·
Elsevier eBooks
·
2
Static and Dynamic Laser Stimulation Techniques for Advanced Failure Analysis
2026
·
Mike Bruce
·
Proceedings - International Symposium for Testing and Failure Analysis
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Works count:
32
Citation count:
809
H-index:
15
I10-index:
17
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