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Bayram Katırcıoğlu

Observed names: Bayram KATIRCIOĞLU, Bayram Katircioglu, Bayram Katircioğlu, Bayram Katircioḡlu, Bayram Katırcıogˇlu, KATIRCIOĞLU, BAYRAM, Katırcıoğlu, Bayram, Prof Dr. Bayram Katırcıoğlu
OpenAlex ID: A5111597956
Photoluminescence analyses of hydrogenated amorphous silicon nitride thin films
2011 · Mustafa Anutgan, Tamila (Aliyeva) Anutgan, et al. · Journal of Luminescence · 25
Electroformed silicon nitride based light emitting memory device
2017 · Tamila Anutgan, Mustafa Anutgan, et al. · Applied Physics Letters · 16
Large area uniformity of plasma grown hydrogenated nanocrystalline silicon and its application in TFTs
2010 · Tamila Aliyeva Anutgan, Mustafa Anutgan, et al. · Journal of Non-Crystalline Solids · 14
Effects of tail states on the conduction mechanisms in silicon carbide thin films with high carbon content
2011 · Kıvanç Sel, Barış Akaoğlu, et al. · Solid-State Electronics · 13
Admittance analysis of an MIS structure made with PECVD deposited a-SiNx:H thin films
1999 · İsmail Atilgan, Serhat Özder, et al. · Journal of Non-Crystalline Solids · 11
Optimization of n+ nc-Si:H and a-SiNx:H layers for their application in nc-Si:H TFT
2011 · Tamila (Aliyeva) Anutgan, Mustafa Anutgan, et al. · Vacuum · 10
Electroforming of Amorphous Silicon Nitride Heterojunction $pin$ Visible Light Emitter
2011 · Mustafa Anutgan, Tamila Anutgan, et al. · IEEE Transactions on Electron Devices · 8
Capacitance analyses of hydrogenated nanocrystalline silicon based thin film transistor
2011 · Tamila (Aliyeva) Anutgan, Mustafa Anutgan, et al. · Thin Solid Films · 8
Stability and degradation of plasma deposited boron nitride thin films in ambient atmosphere
2009 · Tamila Aliyeva Anutgan, Mustafa Anutgan, et al. · Thin Solid Films · 8
Instability phenomenon originated from the disordered layer of the plasma-deposited BN film/c-Si interface assessed through the MIS structure by admittance measurement
2008 · Orhan Özdemir, Mustafa Anutgan, et al. · Semiconductor Science and Technology · 8
Frequency dependence of conductivity in intrinsic amorphous silicon carbide film, assessed through admittance measurement of metal insulator semiconductor structure
2005 · Orhan Ozdemir, Ismail Atilgan, et al. · Thin Solid Films · 7
Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses
2001 · Orhan Özdemir, İsmail Atılgan, et al. · Journal of Non-Crystalline Solids · 7
Effects of surface potential fluctuations on DLTS of MOS structure
1996 · Serhat Özder, İsmai̇l Atilgan, et al. · Solid-State Electronics · 7
Electrical transport mechanism in boron nitride thin film
2009 · Orhan Özdemir, Mustafa Anutgan, et al. · Journal of Non-Crystalline Solids · 6
Correlation between optical path modulations and transmittance spectra of a-Si:H thin films
2000 · Barış Akaoğlu, İsmail Atılgan, et al. · Applied Optics · 6
Annealing improvement on the localized states of plasma grown boron nitride film assessed through admittance measurements
2008 · Orhan Özdemir, Mustafa Anutgan, et al. · Journal of Alloys and Compounds · 5
Abnormal frequency dispersion of the admittance associated with a chromium/plasma deposited a-SiNx:H/p-Si structure
2007 · Orhan Özdemir, İsmail Atilgan, et al. · Journal of Non-Crystalline Solids · 4
Similar admittance behavior of amorphous silicon carbide and nitride dielectrics within the MIS structure
2007 · Orhan Özdemir, İsmail Atılgan, et al. · Vacuum · 3
New approach to bias scan DLTS for rapid evaluation of interface states in MOS structures
1996 · Serhat Özder, ⌟smail Atilgan, et al. · Solid-State Electronics · 3
Analysis of the standard deviation of surface potential fluctuations in MOS interface from DLTS spectra
1998 · Serhat Özder, Ismail Atilgan, et al. · Modelling and Simulation in Materials Science and Engineering · 1
Bor nitrür üretimi
2008 · Özbelge, Önder H., Katırcıoğlu, Bayram, et al. · OpenMETU (Middle East Technical University)
PDF
Barış Akaoğlu, Kıvanç Sel, İsmail Atılgan, Bayram Katırcıoğlu, ‘a-Si1-xCx:H İnce Filmlerin Optik Sabitlerinin Karbon Oranı İle Ayarlanabilmesi’
2004 · ATILGAN, İSMAİL, KATIRCIOĞLU, BAYRAM, et al. · Çanakkale Onsekiz Mart University AVESIS
Instability evolution within a-SiNx film assessed through MIS structure under bias and temperature stresses,", J. Non-cryst. Sol., 296, 27-38, 2001.
2001 · Katırcıoğlu, Bayram, ÖZDEMİR, Orhan, et al. · Yildiz Technical University - AVESIS
Admittance analyis of an MIS structure made with PECVD deposited a-SiNx:H films
1999 · Katırcıoğlu, Bayram, Özder, Serhat, et al. · Yildiz Technical University - AVESIS
Investigation of the a-Si:H Film Deep Localized States by Capacitance DLTS
1996 · İsmail ATILGAN, Serhat ÖZDER, et al. · TURKISH JOURNAL OF PHYSICS
Works count: 31
Citation count: 170
H-index: 8
I10-index: 6
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