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Jeffrey D. Brown

Institution: IBM (United States)
Observed institution: IBM (United States)
OpenAlex ID: A5111637285
Reliability assessment of AlGaN/GaN HEMT technology on SiC for 48V applications
2008 · Sangmin Lee, Ramakrishna Vetury, et al. · IEEE International Reliability Physics Symposium proceedings · 47
Performance, Reliability, and Manufacturability of AlGaN/GaN High Electron Mobility Transistors on Silicon Carbide Substrates
2006 · Jeffrey D. Brown, Shawn Gibb, et al. · ECS Transactions · 20
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High Performance Processor Development for Consumer Electronics Game Processor Perspective
2007 · Jeffrey D. Brown · Symposium on VLSI Circuits · 3
Plenary speaker
2014 · Jeffrey D. Brown · IEEE International System-on-Chip Conference (SOCC)
Performance, Reliability, and Manufacturability of AlGaN/GaN High Electron Mobility Transistors on Silicon Carbide Substrates
2006 · Jeffrey D. Brown, Shawn Gibb, et al. · ECS Meeting Abstracts
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Ultraviolet photodetectors and imaging arrays based on III-V nitride heterostructures
2000 · Jeffrey D. Brown
Works count: 6
Citation count: 70
H-index: 3
I10-index: 2
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