Author

Young-Gook Son

Observed name: YOUNG-GOOK SON

Observed institution: Pusan National University

OpenAlex ID: A5111637735

An XPS study and electrical properties of Pb1.1Zr0.53Ti0.47O3/PbO/Si (MFIS) structures according to the substrate temperature of the PbO buffer layer

2005 · Chul-Ho Park, Mi-Sook Won, et al. · Applied Surface Science · 18

Microstructure and ferroelectric properties of r.f. magnetron sputtering derived PZT thin films deposited on interlayer (PbO/TiO2)

2004 · Chul-Ho Park, Young-Gook Son, et al. · Microchemical Journal · 13

Pyroelectric properties and X-ray photoelectron spectroscopic study of R.F. magnetron-sputtering-derived PZT thin films deposited on various interlayers

2006 · Chul-Ho Park, Mi-Sook Won, et al. · Journal of Electroceramics · 6

FERROELECTRIC PROPERTIES OF PZT/TiO2 STRUCTURE ACCORDING TO THE DEPOSITION CONDITION OF TiO2 INTERLAYER

2005 · CHUL-HO PARK, YOUNG-HUN OH, et al. · Integrated ferroelectrics · 5

Interfacial conditions and electrical properties of the SrBi2Ta2O9/ZrO2/Si (MFIS) structure according to the heat treatment of the ZrO2 buffer layer

2005 · Chul-Ho Park, Jae-Hyun Kim, et al. · Applied Surface Science · 3

Effects of Oxygen Flow Ratio on the Structural and Optical Properties of Al-doped ZnO Thin Films

2007 · Young-Gook Son, Dong-Hyun Hwang, et al. · Applied Science and Convergence Technology · 2

Properties of SBT Thin Film Synthesized by Self-seed Layer Method

2007 · Hyung-Sub Kim, Dong-Hyun Hwang, et al. · Applied Science and Convergence Technology · 2

FERROELECTRIC PROPERTIES OF Pt/PbZr0.53Ti0.47O3/PbO/Si (MFIS) STRUCTURES ACCORDING TO THE SUBSTRATE TEMPERATURE DURING THE PBO BUFFER LAYER DEPOSITION

2005 · CHUL-HO PARK, MI-SOOK WON, et al. · Integrated ferroelectrics

THE EFFECT OF THE DEPOSITION CONDITION OF THE PbO BUFFER LAYER ON THE INTERFACIAL CONDITION OF Pb1.1Zr0.53Ti0.47O3/PbO/Si STRUCTURES

2005 · CHUL-HO PARK, YOUNG-HUN OH, et al. · Integrated ferroelectrics

Works count: 9

Citation count: 49

H-index: 4

I10-index: 2