Author

C. Dumouchel

Observed institution: Suss Microoptics (Switzerland)
OpenAlex ID: A5111673158
2008 · A. Bich, J. Rieck, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 25
2008 · K. J. Weible, A. Bich, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
2008 · R. Bitterli, Toralf Scharf, et al. · Infoscience (Ecole Polytechnique Fédérale de Lausanne)
2008 · R. Bitterli, Toralf Scharf, et al. · Infoscience (Ecole Polytechnique Fédérale de Lausanne)
Works count: 4
Citation count: 25
H-index: 1
I10-index: 1
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