Author

C. Stephens

1990 · N. Esser, M. Reckzügel, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 28
1992 · N. Esser, D.R.T. Zahn, et al. · Applied Surface Science · 27
1989 · K Fives, R McGrath, et al. · Journal of Physics Condensed Matter · 25
1990 · C. Stephens, D. R. T. Zahn, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 16
1990 · D.R.T. Zahn, W. Richter, et al. · Applied Surface Science · 12
1988 · A. B. McLean, I. T. McGovern, et al. · Physical review. B, Condensed matter · 12
1992 · D.R.T. Zahn, N. Esser, et al. · Applied Surface Science · 7
2006 · G. Cabailh, B. N. Holland, et al. · Journal de Physique IV (Proceedings) · 4
1990 · C Stephens, D.R.T Zahn, et al. · Vacuum · 4
1988 · C. Stephens, I. T. McGovern, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 4
1991 · I.T. McGovern, C. Stephens, et al. · Surface Science · 3
1989 · D R T Zahn, N Esser, et al. · Journal of Physics Condensed Matter · 3
1988 · C Stephens, GJ Hughes, et al. · Vacuum · 3
2009 · B. N. Holland, C. Stephens, et al. · e-Journal of Surface Science and Nanotechnology
1989 · C Stephens, R Cimino, et al. · Journal of Physics Condensed Matter
Works count: 15
Citation count: 148
H-index: 7
I10-index: 6
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