Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
K. S. Shin
Observed names:
K.S. Shin,
Kyoung Sik Shin
Observed institutions:
Chinese Academy of Sciences,
Samsung (South Korea),
Shenzhen Institutes of Advanced Technology,
Samsung Electronics (South Korea)
OpenAlex ID:
A5111761561
Influence of titanium interlayer thickness distribution on mechanical properties of Ti/TiN multilayer coatings
2017
·
C.L. Jiang
, H.L. Zhu
, et al.
·
Thin Solid Films
·
57
Aspect ratio dependent plasma-induced charging damage in rf precleaning of a metal contact
2001
·
J. Kim
, K. S. Shin
, et al.
·
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
·
12
Evaluation of cellulase effect on the refining process of softwood bleached kraft pulp
2024
·
Sung Gyu Park
, Ji Hyun Tak
, et al.
·
BioResources
·
3
Synthesis of SiNx:H films in PECVD using RF/UHF hybrid sources
2015
·
K. S. Shin
, Bibhuti B. Sahu
, et al.
·
한국진공학회 학술발표회초록집
Etch rate monitoring with optical emission spectra in dry etching process
2011
·
S. W. Park
, G. J. Seong
, et al.
·
IEEE International Conference on Plasma Science (ICOPS)
The characterization of MOSFET type photosenser for CMOS image sensor
2001
·
Y. S. Lee
, K. S. Shin
, et al.
Show more works
View as search
Works count:
6
Citation count:
72
H-index:
3
I10-index:
2
Year
Topic
Type