Author

Soenke Seebacher

Observed names: S Seebacher, S. Seebacher

Institution: Bremen Institute for Applied Beam Technology

Observed institution: Bremen Institute for Applied Beam Technology

OpenAlex ID: A5111802974

The determination of material parameters of microcomponents using digital holography

2001 · S Seebacher, W Osten, et al. · Optics and Lasers in Engineering · 112

Measuring shape and deformation of small objects using digital holography

1998 · Soenke Seebacher, Wolfgang Osten, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 92

Combined measurement of silicon microbeams by grating interferometry and digital holography

1998 · Werner P. O. Jueptner, Malgorzata Kujawinska, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 21

Absolute shape control of microcomponents using digital holography and multiwavelength contouring

2001 · Wolfgang Osten, Soenke Seebacher, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 14

3D-deformation analysis of microcomponents using digital holography

1997 · Soenke Seebacher, Wolfgang Osten, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13

Application of digital holography for the inspection of microcomponents

2001 · Wolfgang Osten, Soenke Seebacher, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 12

Qualification of optical measurement techniques for the investigation of material parameters of microcomponents

1999 · Wolfgang Osten, Werner P. O. Jueptner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 10

Inspection of nano-sized SNOM-tips by optical far-field evaluation

2001 · S. Seebacher, W. Osten, et al. · Optics and Lasers in Engineering · 5

Combined 3D-shape and deformation analysis of small objects using coherent optical techniques on the basis of digital holography

2000 · Soenke Seebacher, Torsten Baumbach, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5

Messtechnische Grundlagen zur Inspektion von Mikrokomponenten mittels Digitaler Holografie (The Metrological Basis for the Inspection of Microcomponents by Digital Holography)

2001 · Wolfgang Osten, S. Seebacher, et al. · tm - Technisches Messen · 4

Ein Messsystem zur Bestimmung von Materialkennwerten an Mikrokomponenten auf Basis der Digitalen Holografie (A Measurement System for the Determination of Material Properties of Microcomponents on the Basis of Digital Holography)

2001 · Wolfgang Osten, S. Seebacher, et al. · tm - Technisches Messen · 2

Determination of geometric properties of SNOM tips by means of combined far-field and near-field evaluation.

1999 · Soenke Seebacher, Wolfgang Osten, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2

Determination of geometric properties of SNOM tips by means of combined far-field and near-field evaluation

1999 · Soenke Seebacher, Wolfgang Osten, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1

Determination of geometric properties of SNOM tips by means of far-field evaluation

2000 · Soenke Seebacher, Wolfgang Osten, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Combined measurement of shape and deformation of microcomponents by holographic interferometry and multiple-wavelength contouring

1999 · Soenke Seebacher, Wolfgang Osten, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Works count: 15

Citation count: 293

H-index: 7

I10-index: 7