Author

Pascal Joffre

Observed names: P. Joffre, Pascal Joffre Pascal Joffre
Observed institution: Technicolor (France)
OpenAlex ID: A5111831482
1993 · D. Dolfi, M. Labeyrie, et al. · Electronics Letters · 125
1992 · Henri Rajbenbach, Sambath Bann, et al. · Applied Optics · 57
1997 · Fréderic Guérin, Jean-Marc Chappe, et al. · Japanese Journal of Applied Physics · 53
1993 · G. Couturier, B. Jean, et al. · Materials Science and Engineering B · 13
1989 · P. Joffre, G. Illiaquer, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 11
1993 · G. Couturier, B. Jean, et al. · Journal of Applied Physics · 9
1995 · Daniel Dolfi, Pascal Joffre, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
1994 · Daniel Dolfi, Pascal Joffre, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
1994 · B. Jean, G. Couturier, et al. · Journal of Applied Physics · 6
2007 · Morgan Madec, Wilfried Uhring, et al. · Optics Communications · 3
1991 · Sylvie Maze, Pascal Joffre, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
2006 · Morgan Madec, Wilfried Uhring, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
2014 · Marc Tedetti, Caroline Bachet, et al. · EGU General Assembly Conference Abstracts
1994 · Daniel Dolfi, Michele Labeyrie, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
1993 · G. Couturier, B. Jean, et al. · European Materials Research Society symposia proceedings
1990 · Emmanuel Calais, Pascal Joffre · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
1987 · Pascal Joffre, G. Illiaquer, et al. · Conference on Lasers and Electro-Optics
Works count: 20
Citation count: 491
H-index: 8
I10-index: 7
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